Integrated Circuit Test Engineering(不知道有人发过没有，请看了介绍再下)

lijian9600 · 发表于 2016-7-14 10:09:35

thaks for sharing.

chipdesign · 发表于 2016-7-14 10:41:27

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chipdesign · 发表于 2016-7-14 11:02:52

For many circuits, the relationship between Vg and Id can be defined by considering it in a combined way according
to the fluctuations set forth in (1) to (4) above.

chipdesign · 发表于 2016-7-14 12:36:35

[Examination flow]

1) Voltage fluctuation resulting from a mismatch between the M1 and

M2 elements (See the theoretical equation (3))

2) Current fluctuation resulting from a mismatch between the M3 and

M4 elements (See the theoretical equation (4))

3) Systematic offset addition resulting from fluctuations in constant

current of M3 and M4

For many circuits, the relationship between Vg and Id can be defined by considering it in a combined way according

to the fluctuations set forth in (1) to (4) above.

wgygzy · 发表于 2016-8-17 22:08:49

good good

jimcmwang · 发表于 2016-8-18 12:35:22

Integrated Circuit Test Engineering-2006.pdf (2.67 MB)

兔窝的猫猫 · 发表于 2016-8-18 18:09:57

好资料，谢谢LZ

chipdesign · 发表于 2016-8-31 08:03:52

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chipdesign · 发表于 2016-8-31 08:10:36

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chipdesign · 发表于 2016-8-31 15:48:15

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Integrated Circuit Test Engineering(不知道有人发过没有，请看了介绍再下)

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