|
马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。
您需要 登录 才可以下载或查看,没有账号?注册
x
IEEE's papers
1,Failure mechanisms of IGBT's under short-circuit and clamped inductive switching stress
2,A STUDY ON THE SHORT CIRCUIT DESTRUCTION OF IGBT
3,An experimantal and numerical study on the forward biased SOA of IGBT'S
4,A Novel Protection Technique Devoted to the Improvement of the Short Circuit Ruggedness of IGBTs
5,Non Thermal Destruction Mechanisms of IGBTs in Short Circuit Operation
6,Short circuit behavior of IGBTs correlated to the intrinsic device structure and on the application circuit |
|