Quiescent Current Testing of CMOS Data Converters

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TABLE OF CONTENTS
ACKNOWLEDGMENTS............................................................................................................ ii
LIST OF TABLES.........................................................................................................................v
LIST OF FIGURES..................................................................................................................... vi
ABSTRACT ............................................................................................................................... ix
CHAPTER 1. INTRODUCTION.................................................................................................1
1.1 Need for Testing Mixed Signal Circuits ...........................................................................3
1.1.1 Bridging Faults...............................................................................................................3
1.1.2 Gate Oxide Short Defects ..............................................................................................3
1.1.3 Open Faults ....................................................................................................................6
1.2 Testing Mixed Signal Integrated Circuits .........................................................................6
1.3 Quiescent Current (IDDQ) Testing....................................................................................12
1.4 ΔIDDQ Testing ..................................................................................................................14
1.5 Combined Oscillation, Quiescent Current and Transient Current (IDDT)
Testing............................................................................................................................17
1.6 Noise Modeling Based Testing.......................................................................................19
1.7 Fault Injection Transistors ..............................................................................................19
1.8 Scope of Research...........................................................................................................20
CHAPTER 2. ΔIDDQ TESTING OF CMOS ANALOG-TO-DIGITAL
CONVERTER......................................................................................................23
2.1 Introduction....................................................................................................................23
2.2 ΔIDDQ BICS Design.........................................................................................................24
2.3 12-Bit ADC Design.........................................................................................................26
2.4 Results and Discussion ...................................................................................................37
2.5 Conclusion ......................................................................................................................56
CHAPTER 3. ΔIDDQ TESTING OF CMOS DIGITAL-TO-ANALOG
CONVERTER......................................................................................................59
3.1 Introduction....................................................................................................................59
3.2 Built-in Current Sensor for ΔIDDQ Testing......................................................................59
3.3 12-Bit Digital-to-Analog Converter Design ...................................................................62
3.4 Result and Discussion.....................................................................................................67
3.5 Conclusion ......................................................................................................................72
CHAPTER 4. COMBINED OSCILLATION, TRANSIENT POWER SUPPLY
CURRENT AND QUIESCENT CURRENT TESTING OF
CMOS AMPLIFIER CIRCUITS.......................................................................74
4.1 Introduction....................................................................................................................74
4.2 Oscillation Testing Method.............................................................................................76
4.3 IDDQ Testing Using BICS ................................................................................................80
4.4 IDDT Testing.....................................................................................................................82
iv
4.5 Combined Oscillation and IDDQ Test Methodology ........................................................82
4.6 Combined IDDT, Oscillation and IDDQ Test Methodology ...............................................96
4.7 Conclusion ....................................................................................................................110
CHAPTER 5. CONCLUSIONS AND SCOPE FOR FUTURE WORK...............................112
5.1 Scope of Future Work...................................................................................................115
REFERENCES………...............................................................................................................117
APPENDIX – A. A SIMPLE NOISE MODELING BASED TESTING OF
CMOS ANALOG INTEGRATED CIRCUITS ............................................. 127
APPENDIX – B. SPICE LEVEL 3 MOS MODEL PARAMETERS FOR
MOSIS 1.5 μm n-WELL CMOS TECHNOLOGY ....................................... 143
APPENDIX – C. SPICE LEVEL 7 MOS MODEL PARAMETERS FOR
MOSIS 0.5 μm n-WELL CMOS TECHNOLOGY ....................................... 144
APPENDIX – D. LIST OF PUBLICATIONS.........................................................................146
VITA…………………………………………………………………………………………
147

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Quiescent Current Testing of CMOS Data Converters

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