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发表于 2009-2-24 10:08:28
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A 1V 2.5GSs 8-bit self-calibrated flash ADC in 90nm GP CMOS
A 1V 2.5GSs 8-bit self-calibrated flash ADC in 90nm GP CMOS
by Yu, Hairong, Ph.D., University of California, Los Angeles, 2008, 167 pages; AAT 3322043
Abstract (Summary)
High-speed (GS/s), medium-resolution (6∼8b) and low-power analog-to-digital converters (ADCs) are essential in realizing multi-Gb/s communication systems. Ever increased devices mismatch, decreased supply voltage and excessive power consumption prevent current GS/s single-channel CMOS converters from being extended to 8-bit. The purpose of this research project is to develop a more efficient architecture to push the performance limit of high-speed medium-resolution converters, and to evolve the circuits necessary for implementing this architecture in deep-scaled digital CMOS technologies.
Flash- and Folding-ADCs are the primary candidates for GS/s applications due to their high conversion speed and low latency. Though folding-ADCs use fewer comparators and simpler encoder circuits, they demand larger voltage headroom, are more sensitive to device mismatch and less amenable to calibration due to the folding action. In deep-scaled CMOS technologies, comparators and encoder circuits consume less power and silicon area, and therefore, flash ADCs can be pushed to achieve higher resolutions. This work presents an 8b flash ADC that employs THA buffer self-biasing and reference regeneration to boost the ADC full scale and correct mismatch induced offset errors without sacrificing the input bandwidth and sampling speed.
The single-channel and two-channel interleaved prototype ADCs are fabricated in a 90nm GP CMOS. The single-channel ADC achieves 7, 6.9, 6.5 and 6.3 bit ENOB at 1.25GS/s for signal frequencies of 10MHz, 0.6, 1.3, and 1.95 GHz, respectively, and better than 50dB SFDR over 1.2GHz input band, while dissipating 243mW from a single 1V supply. The two-channel interleaved ADC attains 6.8, 6.5 and 6.0 bit ENOB at 2.5GS/s for signal frequencies of 10MHz, 300MHz and 1.1GHz, respectively, and consumes 453mW. The active die area for a single-channel and a two-channel ADC is 0.66mm 2 and 1.43mm 2 respectively.
Compared with the state-of-the art of high-speed and medium-resolution converters, the single-channel ADC achieves the highest sampling rate of 1.55GS/s and widest effective resolution bandwidth of 1.3GHz, and cost-effective manufacturing. |
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