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发表于 2008-9-22 17:03:35
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8.An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process
9.X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs
10.Match Sensing Using Match-Line Stability in Content-Addressable Memories (CAM) |
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