Cambridge University Press-Testing of Digital Systems

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[size=120%]Testing of Digital Systems
By N. K. Jha, S. Gupta

Publisher: Cambridge University Press
Number Of Pages: 1016
Publication Date: 2003-05-15
ISBN-10 / ASIN: 0521773563
ISBN-13 / EAN: 9780521773560
Binding: Hardcover

Product Description:
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

                               
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[ 本帖最后由 woainio 于 2008-7-19 14:41 编辑 ]

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