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Improvement of Breakdown characteristics of LDMOSFETs with Uneven Racetrack Source for PDP Driver Application:
ABSTRACT¾ We investigated the electrical characteristics
of p-channel double-diffused MOSFETs (p-LDMOSFETs) with
an uneven racetrack source (URS) and a conventional
racetrack source (CRS) for PDP driver IC applications. The
breakdown voltage of the p-LDMOSFET with the URS in offstate
was nearly the same as the p-LDMOSFET with the CRS.
However, the breakdown voltage of the p-LDMOSFET with the
URS in on-state was about 30% higher than that of the p-
LDMOSFET with the CRS, while the saturated drain current
of the p-LDMOSFET with the URS was only about 4% lower
than that of the p-LDMOSFET with the CRS.
[ 本帖最后由 suk.qi 于 2008-7-3 13:15 编辑 ] |
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