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[ebook]Advanced Test Methods for SRAMs

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发表于 2009-10-10 09:56:26 | 显示全部楼层 |阅读模式

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[size=120%]Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
By Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel


  • Publisher:   Springer
  • Number Of Pages:   171
  • Publication Date:   2009-10-16
  • ISBN-10 / ASIN:   1441909370
  • ISBN-13 / EAN:   9781441909374


Product Description:

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

Advanced Test Methods for SRAMs.rar

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发表于 2009-10-10 14:08:20 | 显示全部楼层
学习一下,谢谢大家
发表于 2009-10-11 22:51:31 | 显示全部楼层
xiexie
发表于 2009-10-13 16:03:04 | 显示全部楼层
太谢谢了,需要多多了解一下
发表于 2009-12-22 14:24:33 | 显示全部楼层



:)
发表于 2010-1-2 19:26:11 | 显示全部楼层
thanks
发表于 2010-2-2 11:34:43 | 显示全部楼层
thanks for sharing!
发表于 2010-2-7 01:35:56 | 显示全部楼层
3# lufeng21cn XIEXIE
发表于 2010-2-7 01:49:07 | 显示全部楼层
10# zarba xiexie
发表于 2010-2-7 12:21:15 | 显示全部楼层
thanks
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