验证 ※ 测试系列新书

luoyih · 发表于 2008-9-9 09:18:48

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Testing of Digital Systems

Product Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Book Description
As the complexity of modern digital systems increases, so does the need for ever more rigorous testing at all levels, from individual chips up to complete system architectures. This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing. It covers every key topic, including fault simulation, CMOS testing, design for testability, and built-in self test. The book is aimed at graduate students of electrical and computer engineering, and is the most up-to-date reference volume on the market for practicing engineers.
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Product Details
* Hardcover: 1016 pages
* Publisher: Cambridge University Press; 1 edition (May 15, 2003)
* Language: English
* ISBN-10: 0521773563
* ISBN-13: 978-0521773560

luoyih · 发表于 2008-9-9 09:23:05

第二部分

luoyih · 发表于 2008-9-9 09:28:21

Book Description
A must-read in formal and semi-formal verification!
Product Description
This book will explain how to verify SoC logic designs using formal and semi-formal verification techniques. The critical issue to be addressed is whether the functionality of the design is the one that the designers intended. Simulation has been used for checking the correctness of SoC designs (as in functional verification), but many subtle design errors cannot be caught by simulation. Recently, formal verification, giving mathematical proof of the correctness of designs, has been getting much more attention. So far, most of the books on formal verification target the register transfer level (RTL) or lower levels of design. For higher design productivity, it is essential to debug designs as early as possible. That is, designs should be completely verified at very abstracted design levels (higher than RTL). This book covers all aspects of high-level formal and semi-formal verification techniques for system level designs.
First book that covers all aspects of formal and semi-formal, high-level (higher than RTL) design verification targeting SoC designs.
Formal verification of high-level designs (RTL or higher).
Verification techniques are discussed with associated system-level design methodology.
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Product Details
* Hardcover: 256 pages
* Publisher: Morgan Kaufmann (October 23, 2007)
* Language: English
* ISBN-10: 0123706165
* ISBN-13: 978-0123706164

luoyih · 发表于 2008-9-9 09:30:53

剩下的书请在这里头找：
奥运送书之一：System + Memory + Test 系列在 Analog/RF IC 资料共享版里，网址如下
http://www.eetop.cn/bbs/thread-121838-1-1.html

奥运送书之一：System + Memory + Test 系列书名如下
Portable Appliance Testing In-Service Inspection and Testing of Electrical Equipment
Accelerated Testing and Validation (by Alex Porter)
Design of Systems on a Chip Design and Test (Ricardo Reis)
A Practical Guide for SystemVerilog Assertions
Digital Storage in Consumer Electronics The Essential Guide (Thomas M. Coughlin)
Automatic Design of Electronic Circuits and Systems by Genetic Algorithms
Microelectronics – Systems and Devices (Owen Bishop)
NONVOLATILE MEMORY ECHNOLOGIES WITH EMPHASIS ON FLASH A Comprehensive Guide
Principles of Communication System Simulation with Wireless Aplications
Essential Issues in SOC Design Designing Complex Systems-on-Chip

奥运送书之一：System + Memory + Test 系列书籍图片