求ieee上的论文

zlyzzz1

Enhancing DFT Performance: The Power of Scan Compression and Lockup Latches | IEEE Conference Publication | IEEE Xplore

A novel fully automated multi-mode scan stitching methodology | IEEE Conference Publication | IEEE Xplore
An efficient scandump methodology to left shift DFT testing into Gate-level Verification | IEEE Conference Publication | IEEE Xplore
Improved Scan Chain Stitching for Reducing Test Power | IEEE Conference Publication | IEEE Xplore

启明

这几篇是吧。