| 
 | 
 
悬赏100资产已解决
 
这本书有人有吗? 
 
 
Overview 
Authors:Hakan Kuntman ,  
Deniz Özenli ,  
Fırat Kaçar ,  
Yasin Özçelep 
Presents recent advances in statistical method based reliability estimation of MOS transistors 
Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented 
Discusses design examples for specific application areas, enabling readers to follow recent advances and trends 
 
 
 
https://link.springer.com/book/9783031854545 
 
 
 
 |   
 
 
 
 
 
 |