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 Overview
 Authors:Hakan Kuntman ,
 Deniz Özenli ,
 Fırat Kaçar ,
 Yasin Özçelep
 Presents recent advances in statistical method based reliability estimation of MOS transistors
 Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented
 Discusses design examples for specific application areas, enabling readers to follow recent advances and trends
 
 
 
 https://link.springer.com/book/9783031854545
 
 
 
 
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