1. reliability and failure analysis of high power led package,作者 :Tan, Cher Ming ; Singh, Preetpal,ISBN:9780128224083,谢谢
2. Semiconductor Device & Failure Analysis - Using Photon Emmission Microscopy,作者 Wai Kin Chim,ISBN13: 9780471492405,谢谢
3. reliability prediction for microelectronics,ISBN:9781394210954,谢谢
感谢各位大佬帮助,非常感谢您的支持!