please upload this paper, Thank you very much

hi_china59

https://ieeexplore.ieee.org/document/9531880

A 0.025% DC Current Mismatch Charge Pump for PLL ApplicationsPublisher: IEEE
Cite This

[url=][size=1.15]PDF[/url]






[size=0.87][size=0.87]Shengyu Liang; Youze Xin; Chenglong Liang; Bin Zhang; Yanlong Zhang; Xiaoli Wang; Li Geng




[url=]All Authors[/url]




https://ieeexplore.ieee.org/document/9531880

Full
Text Views

---

[size=1em]Abstract

[size=1em]Document Sections

• [size=0.9em][url=]I.
  
  Introduction
  [/url]
• [size=0.9em][url=]II.
  
  Conventional CP Circuits and Matching Methods
  [/url]
• [size=0.9em][url=]III.
  
  Current Mismatch and Proposed Charge Pump
  [/url]
• [size=0.9em][url=]IV.
  
  Simulation results
  [/url]
• [size=0.9em][url=]V.
  
  Conclusion
  [/url]
  

[size=1em]Authors

[size=1em]Figures

[size=1em]References

[size=1em]Citations

[size=1em]Keywords

[size=1em]Metrics

Abstract:Charge pump (CP) based PLL is one of the most popular techniques because of its wide capture range and zero static phase offset. An op-amp is used to achieve dynamic current matching in the conventional double op-amp CP. This paper proposes a CP, which adopts simple level shift source follower to match the output voltages of two current mirrors when the output voltage of CP changes. Because one of the high-speed op-amps is deleted, the power consumption and area are cut down without sacrificing the current matching performance. The proposed CP achieves less than 0.025% DC current mismatch with 400 μA charge pump current under 1.2V supply when the output voltage changes from 0.3V to 0.9V in a standard 55 nm CMOS process.



Published in: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)
Date of Conference: 09-11 August 2021
Date Added to IEEE Xplore: 13 September 2021
ISBN Information:

ISSN Information:


INSPEC Accession Number: 21159299
DOI: 10.1109/MWSCAS47672.2021.9531880
Publisher: IEEE
Conference Location: Lansing, MI, USA

Funding Agency:

hi_china59

Please upload this paper.
https://ieeexplore.ieee.org/document/9531880