请帮忙下载IEEE文章

ampper

PBTI under dynamic stress: From a single defect point of view | IEEE Conference Publication | IEEE Xplore
Time-Dependent Variability Related to BTI Effects in MOSFETs: Impact on CMOS Differential Amplifiers | IEEE Journals & Magazine | IEEE Xplore

PBTI in HKMG nMOS Transistors— Effect of Width, Layout, and Other Technological Parameters | IEEE Journals & Magazine | IEEE Xplore


Bias-temperature instabilities of polysilicon gate HfO/sub 2/ MOSFETs | IEEE Journals & Magazine | IEEE Xplore


Intrinsic correlation between PBTI and TDDB degradations in nMOS HK/MG dielectrics | IEEE Conference Publication | IEEE Xplore

谢谢

trumen

见附件，兄弟是搞器件的吗？

ampper

trumen 发表于 2022-8-10 11:01
见附件，兄弟是搞器件的吗？

多谢兄弟，我是搞电路的，这文章用来学习一下