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本帖最后由 shake2004 于 2022-6-8 09:12 编辑
1、Mission Profiles derived from lifetests and field return data using inverse problem theory,Zhongning Liang; Ramun M. Kho,2014 IEEE International Reliability Physics Symposium ;
2、Determination of the stress level for voltage screen of integrated circuits,Ramun M Kho,September 2010Microelectronics Reliability 50(9-11):1210-1214.microrel.2010.07.103
3、Validating Foundry Technologies for Extended Mission Profiles,K. van Dijk,June 2010IEEE Xplore,Conference: Reliability Physics Symposium (IRPS), 2010 IEEE International
4、Control charts in semiconductor manufacturing,Ramun M Kho,January 2003Conference: ENBIS3 / ISIS3 conferenceAt: Barcelona, Spain Project: Statistical Process Control
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