发两本半导体和IC相关的FEMA书籍，搞电子可靠性的设计人员应该有用

lotusky

第一本：Gettering Defects in Semiconductors
by
V.A. Perevos tchikov
and
V.D. Skoupov


Product Details

Hardcover: 388 pages
Publisher: Springer; 1 edition (Oct 26 2005)
Language: English
ISBN-10: 354026244X
ISBN-13: 978-3540262442  

Product Description

Book Description
Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solidstate microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.

[ 本帖最后由 lotusky 于 2007-12-24 16:39 编辑 ]

lotusky

第二本：Data Mining and Diagnosing IC Fails
by
LEENDERT M. HUISMAN
IBM Systems and Technology Group


Produktinformation

Gebundene Ausgabe: 250 Seiten
Verlag: Springer, Berlin; Auflage: 1 (August 2006)
Sprache: Englisch
ISBN-10: 0387249931
ISBN-13: 978-0387249933

Produktbeschreibungen

Synopsis
There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. "Data Mining and Diagnosing IC Fails" addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.

[ 本帖最后由 lotusky 于 2007-12-24 16:58 编辑 ]

俊雅

怎么下载一个文件也要收费罗？

搞得我都穷了，呵呵，真想多下载资料哟。取消可否呢，呵呵！！

moonfull

呵呵，不错，感谢分享！

pedro888

thanks for your information......................
thanks.........................................................

alex_bai

piao

好东东。

这个对量产的分析很有帮助地说

piao

真的很不错