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[原创] Manufacturing Test and DFT

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发表于 2017-10-23 22:04:42 | 显示全部楼层 |阅读模式

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EASY SCAN undersatnding

Manufacturing Test and DFT
As mentioned previously, once the circuit design has been proven and characterized, the circuit moves into volume
manufacturing. At that time emphasis shifts from design concerns to manufacturing concerns. Screening for
manufacturing defects becomes the main focus of test. Structural Vectors become important in this phase to ensure high
fault coverage and quality. These tests are sometimes called Defected-Oriented tests because they are designed to detect
specific defects. Structural vectors are often based upon a gate level circuit model, and their goal

ScanSample.pdf

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发表于 2017-10-24 18:25:54 | 显示全部楼层
thanks
发表于 2017-10-24 18:29:36 | 显示全部楼层
gatelevel
发表于 2017-10-24 20:14:58 | 显示全部楼层
kankan
发表于 2017-10-28 17:39:57 | 显示全部楼层
Thanks
发表于 2017-10-29 21:45:34 | 显示全部楼层
thanks for sharing
发表于 2018-8-10 13:43:55 | 显示全部楼层
感谢分享。
发表于 2018-8-10 23:10:05 | 显示全部楼层
Thank
发表于 2020-1-13 22:26:39 | 显示全部楼层
顶一下。。。
发表于 2020-1-13 22:30:58 | 显示全部楼层
好书。。。
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