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Noise Analysis and Simulation Method for a Single-Slope ADC With CDS in a CMOS Image SensorJimin Cheon; Gunhee Han IEEE Transactions on Circuits and Systems I: Regular PapersYear: 2008, Volume: 55, Issue: 10
Pages: 2980 - 2987, DOI: 10.1109/TCSI.2008.923434
Cited by: Papers (10)
A 640×512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADCD. X. D. Yang; A. E. Gamal; B. Fowler; H. Tian IEEE Journal of Solid-State CircuitsYear: 1999, Volume: 34, Issue: 12
Pages: 1821 - 1834, DOI: 10.1109/4.808907
Cited by: Papers (135)| Patents (26)
High Frame-Rate VGA CMOS Image Sensor Using Non-Memory Capacitor Two-Step Single-Slope ADCsJunan Lee; Himchan Park; Bongsub Song; Kiwoon Kim; Jaeha Eom;Kyunghoon Kim; Jinwook Burm IEEE Transactions on Circuits and Systems I: Regular PapersYear: 2015, Volume: 62, Issue: 9
Pages: 2147 - 2155, DOI: 10.1109/TCSI.2015.2451791
Time-Delay-Integration Architectures in CMOS Image SensorsGérald Lepage; Jan Bogaerts; Guy Meynants IEEE Transactions on Electron DevicesYear: 2009, Volume: 56, Issue: 11
Pages: 2524 - 2533, DOI: 10.1109/TED.2009.2030648
Cited by: Papers (20)| Patents (6)
A CMOS image sensor (CIS) architecture with low power motion detection for portable security camera applicationsSung-Min Sohn; Soo-Hwan Kim; Suh-Ho Lee; Kwang-Jin Lee; Suki Kim IEEE Transactions on Consumer ElectronicsYear: 2003, Volume: 49, Issue: 4
Pages: 1227 - 1233, DOI: 10.1109/TCE.2003.1261221
Cited by: Papers (8)
Wide dynamic range snapshot APS for ultra low-power applicationsA. Fish; A. Belenky; O. Yadid-Pecht IEEE Transactions on Circuits and Systems II: Express BriefsYear: 2005, Volume: 52, Issue: 11
Pages: 729 - 733, DOI: 10.1109/TCSII.2005.852193
Cited by: Papers (5)| Patents (1)
Effects of Negative-Bias Operation and Optical Stress on Dark Current in CMOS Image SensorsTakashi Watanabe; Jong-Ho Park; Satoshi Aoyama; Keigo Isobe; Shoji Kawahito IEEE Transactions on Electron DevicesYear: 2010, Volume: 57, Issue: 7
Pages: 1512 - 1518, DOI: 10.1109/TED.2010.2049220
Cited by: Papers (11)
A numerical analysis of a CMOS image sensor with a simple fixed-pattern-noise-reduction technologyK. Yonemoto; H. Sumi IEEE Transactions on Electron DevicesYear: 2002, Volume: 49, Issue: 5
Pages: 746 - 753, DOI: 10.1109/16.998580
Cited by: Papers (1)| Patents (4)
A 144 × 144 Current-Mode Image Sensor With Self-Adapting Mismatch ReductionYanyi L. Wong; Pamela A. Abshire IEEE Transactions on Circuits and Systems I: Regular PapersYear: 2007, Volume: 54, Issue: 8
Pages: 1687 - 1697, DOI: 10.1109/TCSI.2007.902505
Cited by: Papers (11)
A 64 fJ/step 9-bit SAR ADC Array With Forward Error Correction and Mixed-Signal CDS for CMOS Image SensorsDenis Guangyin Chen; Fang Tang; Man-Kay Law; Xiaopeng Zhong; Amine Bermak IEEE Transactions on Circuits and Systems I: Regular PapersYear: 2014, Volume: 61, Issue: 11
Pages: 3085 - 3093, DOI: 10.1109/TCSI.2014.2334852
Cited by: Papers (6)
1.25 V Supply 0.72 V Output Voltage Swing Two-Step ReadoutCMOS Active Pixel ArchitectureTsung-Hsun Tsai; Richard Hornsey IEEE Sensors JournalYear: 2012, Volume: 12, Issue: 11
Pages: 3277 - 3284, DOI: 10.1109/JSEN.2012.2211009
Suppressing rolling-shutter distortion of CMOS imagesensors by motion vector detectionJung-Bum Chun; Hunjoon Jung; Chong-Min Kyung IEEE Transactions on Consumer ElectronicsYear: 2008, Volume: 54, Issue: 4
Pages: 1479 - 1487, DOI: 10.1109/TCE.2008.4711190
Cited by: Papers (6)| Patents (9)
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