在线咨询
eetop公众号 创芯大讲堂 创芯人才网
切换到宽版

EETOP 创芯网论坛 (原名:电子顶级开发网)

找回密码

  登录   注册  

快捷导航
搜帖子
楼主: namixiaoxin

[资料] Reliability and Failure of Electronic Materials and Devices

[复制链接]
发表于 2021-2-7 15:04:13 | 显示全部楼层
看看再说............
发表于 2021-3-2 15:22:08 | 显示全部楼层
very good
发表于 2023-2-21 20:34:52 | 显示全部楼层
Many thanks for sharing
发表于 2023-2-21 20:36:07 | 显示全部楼层
Thanks for sharing
发表于 2023-3-13 23:21:29 来自手机 | 显示全部楼层
謝謝分享:)
发表于 2023-8-21 22:10:24 | 显示全部楼层
1998 - Reliability and Failure of Electronic Materials and Devices_Milton Ohring

Library of Congress Cataloging-in-Publication Data

Ohring, Milton, 1936-

Reliability and failure of electronic materials and devices / Milton Ohring.

p. cm.

Includes bibliographical references.

ISBN-13: 978-0-12-524985-0 ISBN-10: 0-12-524985-3

1. Electronic apparatus and appliances—Reliability. 2. System failures (Engineering) I. Title.

TK7870.23.037 1998

621.381—dc21     98-16084

CIP

ISBN-13: 978-0-12-524985-0 ISBN-10: 0-12-524985-3

Printed in the United States of America

06 MV 9 8 7 6 5 4 3
发表于 2023-8-21 22:11:35 | 显示全部楼层

This book is printed on acid-free paper.

Copyright © 1998 by Academic Press.

All rights reserved.

No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher.

Permissions may be sought directly from Elsevier's Science and Technology Rights Department in Oxford, UK. Phone: (44) 1865 843830, Fax: (44) 1865 853333, e-mail: permissions@elsevier.co.uk. You may also complete your request on-line via the Elsevier homepage: http://www.elsevier.com by selecting “Customer Support” and then “Obtaining Permissions”.

The cover image is an artist's rendition of an electrostatic spark discharge event that lasts less than one billionth of a second. This miniature lightning bolt from a charged object can easily damage a semiconductor device. The photo is courtesy of Wayne Tan, Advanced Micro Devices.

ACADEMIC PRESS

An Imprint of Elsevier

525 B Street, Suite 1900, San Diego, CA 92101-4495, USA

1300 Boylston Street, Chestnut Hill, MA 02167, USA

http://www.apnet.com

United Kingdom Edition published by

ACADEMIC PRESS LIMITED

An Imprint of Elsevier

24-28 Oval Road, London NW1 7DX

http://www.hbuk.co.uk/ap
发表于 2023-8-21 22:16:01 | 显示全部楼层
谢谢分享
发表于 2024-3-10 09:10:51 | 显示全部楼层
值得一看
发表于 2024-5-12 11:13:09 | 显示全部楼层
gooooooooooood
您需要登录后才可以回帖 登录 | 注册

本版积分规则

关闭

站长推荐 上一条 /2 下一条

小黑屋| 手机版| 关于我们| 联系我们| 隐私声明| EETOP 创芯网
( 京ICP备:10050787号 京公网安备:11010502037710 )

GMT+8, 2025-4-10 18:06 , Processed in 0.024318 second(s), 6 queries , Gzip On, MemCached On.

eetop公众号 创芯大讲堂 创芯人才网
快速回复 返回顶部 返回列表