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 发表于 2012-4-16 18:49:56
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| ATE is so hot if we divided IC testing to Digital and mixed-signal and RF. Digital: General and High Speed and Memory
 Mixed-Signal: DAC and ADC and PLL.
 RF: Up and Down converter and Mixed-Signal.
 
 From computer language (C, C++, VB and Java .....) to ATE hardware control. It is not so easy to handle in the short time......
 
 " If you regarded IC testing as the garbage, your ICs would be the garbage".................
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