Test and Diagnosis of RF Integrated Circuits the system on chip approach

squall418

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits the system on chip approach

Edited by Yichuang Sun
The Institution of Engineering and Technology

Published by The Institution of Engineering and Technology, London, United Kingdom
© 2008 The Institution of Engineering and Technology
First published 2008

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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits the system on chip approach

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