A new concept in RF Wafer Testing

kevinwjs · 发表于 2011-1-3 19:03:04

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Overview
Existing Issues Time/Cost/Thru-put
The Wafer level RF Testing Challenge
The Multi-site Challenge
RF impairments and Solution
Test and Simulation Results
Architecture/Test Changes
Summary

A new concept in RF Wafer Testing.pdf (886.59 KB, 下载次数: 88 )

mtwumtwu · 发表于 2011-1-4 08:32:38

good reference for RF testing

caltech_usa · 发表于 2011-1-9 22:13:34

回复 1# kevinwjs

good a lot

xuyun28 · 发表于 2011-1-18 17:30:25

!!!!!!!!!!!!!!!!!!!

jeter1973 · 发表于 2011-4-19 18:19:59

thanks alot!

[资料] A new concept in RF Wafer Testing

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