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部分介绍：（很多人永用不上，用的人很需要！）
Preface vii
1 Built-in Self-Test 1
1.1 Introduction 1
1.2 Design for Testability 4
1.2.1 Controllability and Observability 4
1.2.2 Ad Hoc Techniques 6
1.2.3 Scan Designs 8
1.2.4 Boundary-Scan Architecture 12
1.2.5 Test Point Insertion 14
1.3 Generation of Test Vectors 17
1.3.1 Exhaustive Testing 17
1.3.2 Pseudo-Exhaustive Testing 17
1.3.3 Pseudo-Random Testing 19
1.3.4 Weighted Patterns 23
1.3.5 Reseeding of Linear Feedback Shift Registers 24
1.3.6 Diffraction 28
1.3.7 Pattern Mapping 30
1.3.8 Scan-Encoded Patterns 30
1.4 Compaction of Test Responses 32
1.4.1 Objectives and Requirements 32
1.4.2 Compaction Schemes 33
1.4.3 Error Models and Aliasing 35
1.5 BIST Schemes for Random Logic 38
1.5.1 Design Rules for BIST 38
1.5.2 Serial BIST Architectures |
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发表于 2010-4-5 13:11:58
