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本帖最后由 northfish 于 2009-10-13 05:21 编辑
作者是SiBeam的创始人之一,SiBeam的主要产品思路就是来源于他的这篇博士论文。
CHAPTER 1 INTRODUCTION 1
1.1 Motivation 1
1.1.1 60-GHz unlicensed spectrum 2
1.1.2 60-GHz wireless standards 4
1.1.3 60-GHz and other wireless technologies 6
1.1.4 Why 60 GHz now? 8
1.2 Thesis Organization 12
1.2.1 Fundamental frequency limits 13
1.2.2 Millimeter-wave CMOS passives 13
1.2.3 Device modeling 14
1.2.4 Microwave CMOS de-embedding 14
1.2.5 Millimeter-wave circuit design 15
CHAPTER 2 DESIGN AND MODELING OF CMOS DEVICES 16
2.1 Introduction 16
2.2 CMOS Technology 16
2.2.1 Front-end features 17
2.2.2 Back-end features 17
2.3 CMOS Transistor Design 18
2.3.1 Maximum oscillation frequency, fmax 19
2.3.2 Mason’s unilateral gain 19
2.3.3 Layout for optimal fmax 22
2.3.4 Measured fmax 23
2.4 Microwave Transistor Modeling 24
2.4.1 Small-signal modeling 25
2.4.2 Noise modeling 28
2.4.3 Large-signal modeling 38
2.5 Transmission Lines 41
2.5.1 Characterizing low-loss transmission lines 42
2.5.2 Inductive quality factor 44
2.5.3 Microstrip vs. coplanar waveguide 45
2.6 Transmission Line Modeling 49
2.6.1 Physical electromagnetic modeling 49
2.6.2 Design-oriented electrical modeling 50
2.7 Conclusion 51
Appendix
A2.1 Q-factor Definitions for Transmission Lines 52
A2.2 Q-factor of a Shorted Transmission Line 53
CHAPTER 3 CMOS ON-WAFER DE-EMBEDDING 56
3.1 Introduction 56
3.2 Accurate S-parameter Measurements on Silicon 58
3.3 Probe Pad Design 59
3.4 Small-Signal De-embedding 60
3.4.1 SOLT calibration 60
3.4.2 TRL calibration 61
3.4.3 Open de-embedding 63
3.4.4 Open-short de-embedding 65
3.4.5 Other de-embedding techniques 66
3.4.6 Summary 66
3.5 Small-Signal De-embedding Verification 67
3.5.1 Through verification 67
3.5.2 TRL verification 68
3.5.3 Z0-invariant parameters for transistors 69
3.5.4 Z0-invariant parameters for transmission lines 72
3.5.5 Summary 74
3.6 Device Noise De-embedding 74
3.6.1 Noisy two-port theory 75
3.6.2 Noise correlation matrices 77
3.6.3 Noise correlation matrices and noise parameters 79
3.6.4 Noise de-embedding of probe pads 79
3.6.5 On-wafer noise parameter measurements 80
3.6.6 Summary 81
3.7 Conclusion 82
CHAPTER 4 CIRCUIT DESIGN AND MEASUREMENT RESULTS 84
4.1 Introduction 84
4.2 Device Test Chips 84
4.3 CPW transmission line circuit design 85
4.4 30-GHz CPW Filter 88
4.5 40-GHz and 60-GHz Amplifiers 90
4.5.1 CPW amplifier design 90
4.5.2 Measured amplifier results 93
Appendix
A4.1 Small-Signal Measurement Setup 97
A4.2 Large-Signal Harmonic Measurement Setup 98
A4.3 Noise Figure Measurement Setup 99
CHAPTER 5 CONCLUSIONS AND FUTURE WORK 100
5.1 Research Summary 100
5.2 Future Work 101
REFERENCES 104 |
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