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Investigating packaging effects on bandgap references

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发表于 2008-11-9 22:07:44 | 显示全部楼层 |阅读模式

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Investigating packaging effects on bandgap references

Author:
Palakodety, Ravi (Ravi Kiran)

Advisor:
Tick Houk and Charles Sodini.


Abstract:


This thesis investigates packaging effects on precision bandgap voltage references used in LTC switching regulators. Packaging stress causes a mean offset and room temperature distribution widening of the bandgap reference output voltage, as well as inconsistent temperature characteristics. Bandgap references with and without a proprietary stress-relief mechanism were compared to determine the impact of packaging stress on reference performance. References without stress-relief showed a mean offset of -2.3mV and spread of 10mV, while references with stress-relief showed a mean offset of -2.0mV and spread of 3.6mV. References with stress relief exhibited more consistent temperature coefficients than references without stress relief. A test chip was fabricated to allow measurement of VBE and AVBE within the bandgap reference. Parts with stress-relief showed tighter VBE and AVBE distributions, as well as more favorable temperature characteristics. The experiments in this thesis show that stress-relief is effective at improving bandgap reference performance.




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 楼主| 发表于 2008-11-9 22:11:49 | 显示全部楼层
封装对Bandgap reference影响 做了比较详细的实验性分析,值得做Voltage reference的朋友参考。
发表于 2008-11-10 18:36:21 | 显示全部楼层
:victory::victory::victory::victory:
发表于 2008-11-12 11:58:56 | 显示全部楼层
发表于 2008-12-4 01:35:36 | 显示全部楼层

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楼主,这内容确实不错,正在找封装对BG性能的影响的资料,希望楼主还能再发点其他对BG性能产生影响是资料 呵呵!
发表于 2016-7-26 16:30:33 | 显示全部楼层
thank you
发表于 2017-10-27 03:28:48 | 显示全部楼层
非常感謝~~~~
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