RF University，HP/AGILENT光盘资料

hzfeiyun

RF University，HP/AGILENT光盘资料

一共4个部分，包括以下内容：

Practical Considerations for Modern
RF & Microwave Phase Noise Measurements

Welcome to the Practical Considerations for Modern RF and uWave phase noise Measurements seminar.
The overall objective of this seminar is to provide practical measurement information which can help you better understand measurement results obtained from modern phase noise measurement solutions


These are the topics that we will discuss today.
Where practical, we will demonstrate the measurement concepts discussed.
The seminar reviews basic noise concepts which are important to remember before we discuss different measurement techniques.
Once the basic techniques are understood, we can determine which are most applicable to the devices we need to measure.
Once we are making measurements, optimizing a measurement becomes important.
The last section of the seminar will discuss the current phase noise measurement solutions available from Hewlett-Packard.


Production Test Places New Requirements on Noise Figure Measurement Techniques

Abstract: Noise figure measurements inherently involve the characterization of low level signals. To make
the most accurate measurements possible, careful attention must be paid to the test setup. Measurement
system noise minimization, accurate noise source characterization, and mismatch reduction or vector error
correction, are among the techniques used to improve accuracy. Traditionally, noise figure measurements
are made on a system dedicated to noise figure testing alone. This allows the user the luxury of optimizing
the test environment for this single measurement and for a specific device under test (DUT). However, the
economics of production test do not allow making multiple connections to each device. All tests needed to
assure specified performance must be made with a single connection to the device. Meeting this demand
requires a departure from the traditional measurement techniques. This paper will review HP’s approach
for making fast, accurate noise figure measurements in the presence of these stringent requirements.

Network Analyzer Error Models and Calibration Methods by Doug Rytting
Network Analyzer Block Diagram and Error Model
System Error Model for Error-Correction
One-Port Error Model and Calibration
Two-Port Error Models and Calibration
12-Term Method
8-Term Method
16-Term Method

Impedance Matching Techniques for RFIC Test
Edwin Lowery
Hewlett Packard Co
Randy Gumabong
TDK Semiconductor Corp

Performing Bluetooth RF Measurements Today
Application Note

Application Note 1325
Performing cdma2000 Measurements Today

Testing and Troubleshooting Digital RF Communications Receiver Designs

Agilent Technologies Wireless Test Solutions
Application Note 1313

Improving Network Analyzer Measurements of Frequency-translating Devices
Application Note 1287-7

Agilent AN 1298
Digital Modulation in Communications Systems—An Introduction
Application Note


此外还包括一些射频测试仪器的介绍等。


[ 本帖最后由 hzfeiyun 于 2008-7-9 16:37 编辑 ]

hzfeiyun

part 1

[ 本帖最后由 hzfeiyun 于 2008-7-9 18:05 编辑 ]

hzfeiyun

part 2

[ 本帖最后由 hzfeiyun 于 2008-7-9 18:19 编辑 ]

hzfeiyun

part 3

[ 本帖最后由 hzfeiyun 于 2008-7-10 09:41 编辑 ]

hzfeiyun

part 4

[ 本帖最后由 hzfeiyun 于 2008-7-10 09:35 编辑 ]

lyx1982

nice document!谢谢共享！

hzfeiyun

都上传好了，有什么问题请回贴

hzfeiyun

hzfeiyun

Aimmy

haohaio