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[size=120%]Power-Constrained Testing
of VLSI Circuits (Frontiers in Electronic Testing)
By Nicola Nicolici, Bashir M. Al-Hashimi
Publisher: Springer Number Of Pages: 180 Publication Date: 2003-02-28 ISBN-10 / ASIN: 140207235X - ISBN-13 / EAN: 9781402072352
Product Description:
Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. Fore researchers
and practitioners. |
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