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[求助] 100信元跪求论文 "Thermally-driven motion of current filaments ..."

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发表于 2012-3-21 12:06:19 | 显示全部楼层 |阅读模式

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"Thermally-driven motion of current filaments in ESD protection devices"
  • a Institute for Solid State Electronics, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
  • b Infineon Technologies, Balanstrasse 73, D-81541 Munich, Germany
  • c Ioffe Physicotechnical Institute, Politechnicheskaya 26, 194021 St. Petersburg, Russia
  • d University of Armed Forces, 85579 Neubiberg, Germany




http://www.sciencedirect.com/science/article/pii/S0038110104003624
发表于 2012-3-22 06:56:34 | 显示全部楼层
Thermally-driven motion of current filaments in ESD protection devices.pdf (735.82 KB, 下载次数: 18 )
 楼主| 发表于 2012-3-22 12:24:07 | 显示全部楼层




    大哥实在是太感谢了。
昨天我还发了两篇文章的求助帖,你可能没有看到。我再把文章贴在这里。你看看能否帮我下载到,多谢了!

"Studies of EOS susceptibility in 0.6 μm nMOS ESD I/O protection structures "
  • a Integrated Circuits Business Division, Technology Development Center, Hewletr-Packard Co., 3500 Deer Creek Road, MS26-U8, Palo Alto, CA 94303-0867, USA
  • b Texas Instruments Incorporated, Semiconductor Process Design Center, M/S 461, P.O. Box 655012, Dallas, TX 75265, USA
  • c University of Illinois at Urbana-Champaign, Coordinated Science Laboratory, 1308 West Main Street, Urbana, IL 61801, USA
  • Received 29 October 1993. Accepted 13 April 1994. Available online 12 February 2003.


http://www.sciencedirect.com/science/article/pii/0304388694900353






"Electrical Overstress Power Profiles: A Guideline to Qualify EOS Hardness of Semiconductor Devices"
  • Carlos Díaza,
  • Sung-Mo Kanga
  • a University of Illinois at Urbana-Champaign, Coordinated Science Laboratory, 1308 West Main Street, Urbana, IL 61801, USA
  • Charvaka Duvvuryb,
  • Larry Wagnerb
  • b Texas Instruments Incorporated, M/S 461, P.O. Box 655012, Dallas, TX 75265, USA
  • Received 13 October 1992. Accepted 6 April 1993. Available online 12 February 2003



http://www.sciencedirect.com/science/article/pii/030438869390007T
发表于 2012-3-23 01:27:11 | 显示全部楼层
Studies of EOS susceptibility in 0.6 μm nMOS ESD IO protection structures.pdf (1.08 MB, 下载次数: 9 )
abbr_4e3702d9cc015c41eb0d11a0105077c3.pdf (1.2 MB, 下载次数: 10 )
发表于 2015-9-29 16:20:24 | 显示全部楼层
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