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楼主 |
发表于 2012-6-14 11:24:24
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仿真时报出error:
// *** ERROR during scan pattern 0 (detected during load of pattern 1)
0 1 0 (exp=1, got=0) // pin scan_so, scan cell 0, T= 957240.00 ns
0 1 2 (exp=0, got=1) // pin scan_so, scan cell 2, T= 957440.00 ns
0 1 4 (exp=1, got=0) // pin scan_so, scan cell 4, T= 957640.00 ns
0 1 6 (exp=0, got=1) // pin scan_so, scan cell 6, T= 957840.00 ns
0 1 8 (exp=1, got=0) // pin scan_so, scan cell 8, T= 958040.00 ns
0 1 10 (exp=0, got=1) // pin scan_so, scan cell 10, T= 958240.00 ns
0 1 12 (exp=1, got=0) // pin scan_so, scan cell 12, T= 958440.00 ns
0 1 14 (exp=0, got=1) // pin scan_so, scan cell 14, T= 958640.00 ns
0 1 16 (exp=1, got=0) // pin scan_so, scan cell 16, T= 958840.00 ns
0 1 18 (exp=0, got=1) // pin scan_so, scan cell 18, T= 959040.00 ns
0 1 20 (exp=1, got=0) // pin scan_so, scan cell 20, T= 959240.00 ns
0 1 22 (exp=0, got=1) // pin scan_so, scan cell 22, T= 959440.00 ns
0 1 24 (exp=1, got=0) // pin scan_so, scan cell 24, T= 959640.00 ns
0 1 26 (exp=0, got=1) // pin scan_so, scan cell 26, T= 959840.00 ns
0 1 28 (exp=1, got=0) // pin scan_so, scan cell 28, T= 960040.00 ns
0 1 30 (exp=0, got=1) // pin scan_so, scan cell 30, T= 960240.00 ns
0 1 32 (exp=1, got=0) // pin scan_so, scan cell 32, T= 960440.00 ns
0 1 34 (exp=0, got=1) // pin scan_so, scan cell 34, T= 960640.00 n
用tetramax产生测试向量报出:
Warning: There were 630 faultable pins lost due to tied gate optimizations. (M126)
There were 129015 primitives and 2434 faultable pins removed during model optimizations
Warning: Rule B7 (undriven module output pin) was violated 605 times.
Warning: Rule B8 (unconnected module input pin) was violated 1090 times.
Warning: Rule B9 (undriven module internal net) was violated 201 times.
Warning: Rule B10 (unconnected module internal net) was violated 754 times.
Warning: Rule N16 (overspecified UDP) was violated 1 times.
Warning: Rule N23 (inconsistent UDP) was violated 1 times
run_atpg basic_scan_only
***********************************************************
* NOTICE: The following DRC violations were previously *
* encountered. The presence of these violations is an *
* indicator that it is possible that the ATPG patterns *
* created during this process may fail in simulation. *
* *
* Rules: N23 *
**********************************************************
不知道具体怎么修改 |
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