急需两篇IEEE的论文，求大家帮忙！！

analogmind

"Advanced CMOS protection device trigger mechanisms during CDM"

This paper appears in:
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
Date of Conference: 12 Sep 1995
Author(s): Duvvury, C.
Semicond. Process & Device Center, Texas Instrum. Inc., Dallas, TX
Amerasekera, A.
On Page(s): 162 - 174

http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=478281&contentType=Conference+Publications&queryText%3DAdvanced+CMOS+protection+device+trigger+mechanisms+during+CDM







"An anti-snapback circuit technique for inhibiting parasitic bipolar conduction during EOS/ESD events ＂

http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=818991&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D818991

This paper appears in:
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Date of Conference: 1999
Author(s): Smith, J.C.
Somerset Design Center, Motorola Inc., Austin, TX
On Page(s): 62 - 69

wlyj000

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2012-4-3 23:52 上传

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回复 1# analogmind

wlyj000

希望没找错

allex_xy

Good sharing!!!

ducvilla

I see that there are many kind of ESD design, but i do not know what's the best method, or practical method. Can any one point to me more clear!
Thanks!

analogmind

回复  analogmind
wlyj000 发表于 2012-4-3 23:53

                               
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    正是我想要的。多谢了，兄弟！

analogmind

I see that there are many kind of ESD design, but i do not know what's the best method, or practical ...
ducvilla 发表于 2012-4-4 19:24

                               
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    ESD设计很难用一句话概括那种方法是最好的。ESD 是一种customed 设计。需要针对实际的应用来设计， 毕竟面积，ESD 能力，工艺，都是需要兼顾考虑的。