100信元跪求论文 "Correlation between EOS customer..."

analogmind · 发表于 2012-3-21 12:14:48

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"Correlation between EOScustomerreturnfailurecases and Over Voltage Stress (OVS) test method"

NXP Semiconductors, 2, rue de la Girafe, 14000 Caen, France
LaMIPS, Laboratoire commun NXP-CRISMAT, UMR 6508 CNRS ENSICAEN UCBN, 2, rue de la Girafe BP 5120, F-14079 Caen Cedex 5, France

http://www.sciencedirect.com/science/article/pii/S0026271409002662

多谢啊!!!

phdseeker · 发表于 2012-3-22 06:11:00

Here you go!

abbr_6d32125b19aa6b898ece729409c2f9de.pdf (872.68 KB , 下载次数: 21 )

analogmind · 发表于 2012-3-22 12:20:04

Here you go!
phdseeker 发表于 2012-3-22 06:11

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大哥，多谢啊！

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[求助] 100信元跪求论文 "Correlation between EOS customer..."