An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers

qitianhua

An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers
L. Dermentzoglou, A. Karagounis, A. Arapoyanni
Dept. of Informatics and Telecommunications
University of Athens
Panepistimioupolis, 15784 Athens, Greece
e-mail: {dermetz, tasoska, [email=arapoyanni}@di.uoa.gr]arapoyanni}@di.uoa.gr[/email]
Y. Tsiatouhas
Department of Computer Science
University of Ioannna
P.O. Box 1186, 45110, Ioannina, Greece
e-mail: tsiatouhas@cs.uoi.gr

Abstract—This paper presents a cost effective Embedded Test
Circuit (ETC) for single ended Low Noise Amplifiers (LNAs).
The ETC operation is based on the observation that the
presence of catastrophic faults, like resistive bridgings, shorts
and opens, or parametric faults, result in the attenuation of the
output voltage amplitude (gain reduction). The ETC along
with a single ended LNA have been designed in a 0.35μm
CMOS technology to evaluate the efficiency of the proposed
approach and experimental results are presented.

火影忍者

良好的數據......

火影忍者

保持良好的工作......

植被

有趣的東西..............

lcp7547

看看是怎么做的，参考一下呵呵呵

09045421

下来看看，希望有用吧

ralphtwtw

An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers

caltech_usa

回复 1# qitianhua

谢谢谢谢1

efong

thanks!

ralphtwtw

An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers