DFT方法在不同工艺和设计怎么选择

traveller123

请教下版内资深DFT大咖，DFT不同方法分别应用在什么工艺和怎样的设计？
比如boundary scan，MBIST，LBIST，scan chain等
scan chain pattern分别针对哪些模型（stuck-at，delay model，IDDQ等）
不同工艺，不同设计，哪些DFT测试是必须的，哪些是可选的？

目前本人的设计主要是0.18um和0.13um，数模混合芯片，存储器只作为配置存储，没有RAM，没有数字IO，应用于工业消费电子（考虑用于汽车），
这样的设计要采用哪些DFT方法？

ic_expert

几乎没选择。
除非特别先进的工艺，比如7ns及以下，不然没选择。

sjtusonic

The goals for automotive electronics are zero defective parts per million (0 DPPM), and safe operation during the expected lifetime of the vehicle. The ISO 26262 standard provides procedures and metrics required before delivery to ensure systems can be expected to operate without unreasonable risk.

ISO 26262 specifies circuit metrics and minimum values that are design requirements. Since the focus of the standard is minimizing the likelihood of unsafe failures, the likelihood of each fault/defect must be estimated to be able to compute these metrics.

This paper first discusses these metrics and their relationship to each other. Then it discusses how to measure each of the metrics with Tessent DefectSim.

https://www.mentor.com/products/ ... 8-8f1d-610011868804