|
马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。
您需要 登录 才可以下载或查看,没有账号?注册
x
Modern high-speed data acquisition systems,such as phased-array radars or high-speed digitizers, continue to push higher both the bandwidth and input-frequency requirementsn without any sacrifice of dynamic range performance. System designers need to deliver the highest possible signal-to-noise ratio (SNR) in order to optimize system performance down to a tenth of a decibel. However, it is well known that as input frequencies increase, the analog-to-digital converter (ADC) SNR becomes increasingly sensitive to the sampling-clock’s timing uncertainty— or jitter. This applies to slower speed but high-precision ADCs with 16-bit resolution or more, and very high SNR. This situation also applies to high-speed 12- and 14-bit
ADCs that have a wide bandwidth front-end
to sample signals at multiple gigahertz. The
SNR degradation follows a well known formula of:
SNR = 20log(2π × fIN × tJitter),
where tJitter is the combination of both external and internal
aperture jitter. Figure 1 shows SNR dependency on the
input frequency and the total amount of clock jitter for an
ADC with 76-dB thermal noise |
|