[ebook 2018] Fundamentals of Electromigration-Aware Integrated Circuit Design

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Fundamentals of Electromigration-Aware Integrated Circuit Design

Author(s): Jens Lienig, Matthias Thiele (auth.)

Description:

The book provides a comprehensive overview of electromigration and its effects on the electronic circuit. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying The present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

Fundamentals of Electromigration-Aware Integrated Circuit Design (2018).pdf (5.54 MB, 下载次数: 209 )

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table of content
1 Introduction
2 Fundamentals of Electromigration
3 Integrated Circuit Design and Electromigration
4 Mitigating Electromigration in Physical Design
5 Summary and Outlook
Index ...................................................... 157

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