DFTcompiler DFT插入partition问题

YouHKH

我现在用synopsys 的DFTC插入DFT电路，采用partition的方式。
出现了以下不理解的地方，望哪个大神指导指导，谢谢！
--针对PG0问题--------------------------------------------------
问题1：
本来想实现的是PG0在Internal_scan模式时，有4条scan chain，即4组SCANIN/OUT组，
但是最后却做出来有5条scan chain，另外1组是test_si1/test_so1，不知道怎么回事？？
问题2：
另外，test_si1/test_so1这条chain中包含的是inst3,inst4中所有的REG。
本来我的设计意图是，PG0中只包含inst1,inst2中的REG，不包含inst3,inst4中的REG，
是不是我哪条commond没有设定，才会出现这种情况？？
  ※PG1也会出现以上问题！！！
--针对insert_dft出现的test mode问题-----------------------------
问题3：
本来设定的test mode是以下关系，
PG0_ScanCompression_mode_0的base_mode是PG0_Internal_scan
PG0_ScanCompression_mode_1的base_mode是PG0_Internal_scan
PG1_ScanCompression_mode的base_mode是PG1_Internal_scan
却在insert_dft时出现了以下信息。
  scan compression mode PG0_ScanCompression_mode_0 with base mode Internal_scan and partition default_dft_partiton
  ...
  scan compression mode PG0_ScanCompression_mode_0 with base mode PG1_Internal_scan and partition PG1
  ....
  1，我没有设定Intetnal_scan模式，为什么会有？
     我知道Internal_scan是default test mode,但是我的PG0_Internal_scan/PG1_Internal_scan本来就是scan test mode啊，

为什么还给我定义一个Internal_scan?

※也默认定义了一个ScanCompression_mode
  2, 为什么会出现PG0_ScanCompression_mode_0 with base mode PG1_Internal_scan and partition PG1?
     PG0_ScanCompression_mode_0和PG1_Internal_scan根本就不在一个partition中，Why？


项目描述：
design name：DUT
DUT中包含以下instance：inst1、inst2、inst3、inst4
                      DUT当前阶层下无其他REG和Cell、无inst5
SCAN IN/OUT 共4组：DFT_IN1、DFT_IN2、DFT_IN3、DFT_IN4
                   DFT_OUT1、DFT_OUT2、DFT_OUT3、DFT_OUT4
TestMode signals ：TM1、TM2、TM3
Scan Enable signals：SE

   
想实现以下功能：
Partition 0:
a),name：PG0
b),PG0包含inst1、inst2两个instance
c),PG0中共包含三种DFTMAX回路（test_mode）：
     PG0_Internal_scan(4 scan in/4 scan out)

PG0_ScanCompression_mode_0(以PG0_Internal_scan为base_mode,4 scan in/4 scan out,压缩倍数25倍，即4 chain->100 chain)

PG0_ScanCompression_mode_1(以PG0_Internal_scan为base_mode,4 scan in/4 scan out,压缩倍数10倍，即4 chain->40 chain)

Partition 1:
a),name：PG1
b),PG1包含inst3、inst4两个instance
c),PG1中共包含两种DFTMAX回路（test_mode）：
     PG1_Internal_scan(4 scan in/4 scan out)

PG1_ScanCompression_mode(以PG1_Internal_scan为base_mode,4 scan in/4 scan out,压缩倍数10倍，即4 chain->40 chain)

DFT insert TCL:

1. define_dft_partition PG0 -default false -include {inst1 inst2}
   
2. define_dft_partition PG1 -default false -include {inst3 inst4}
   
3. set_dft_signal  -type ScanClock ....
   
4. set_dft_signal  -type Reset ....
   
5. set_dft_signal  -type TestMode -port TM1 ....
   
6. set_dft_signal  -type TestMode -port TM2 ....
   
7. set_dft_signal  -type TestMode -port TM3 ....
   
8. set_dft_signal  -type ScanEnable -port SE ....
   
9. define_test_mode PG0_Internal_scan -usage  scan -encoding {TM1 0 TM2 0 TM3 1}
   
10. define_test_mode PG0_ScanCompression_mode_0 -usage  scan_compression  {TM1 0 TM2 1 TM3 0}
    
11. define_test_mode PG0_ScanCompression_mode_1
    
12. define_test_mode PG1_Internal_scan
    
13. define_test_mode PG1_ScanCompression_mode
    
14. current_dft_partition PG0
    
15. set_dft_signal  -type ScanDataIn -port DFT_IN1/2/3/4 ...
    
16. set_scan_path -scandatain DFT_IN1 -scandataout DFT_OUT1
    
17. ...
    
18. set_scan_configuration -chain_count 4 -test_mode PG0_Internal_scan ...
    
19. scan compression enable...(命令搞忘了)
    
20. set_scan_compression_configuration -test_mode PG0_ScanCompression_mode_0 -base_mode PG0_Internal_scan -chain_count 100
    
21. set_scan_configuration -test_mode PG0_ScanCompression_mode_0 ...(scan chain config设定)
    
22. set_scan_compression_configuration -test_mode PG0_ScanCompression_mode_1 -base_mode PG0_Internal_scan -chain_count 40
    
23. set_scan_configuration -test_mode PG0_ScanCompression_mode_1 ...(scan chain config设定)
    
24. 
    
25. current_dft_partition PG1
    
26. set_dft_signal  -type ScanDataIn -port DFT_IN1/2/3/4 ...
    
27. set_scan_path -scandatain DFT_IN1 -scandataout DFT_OUT1
    
28. ...
    
29. set_scan_configuration -chain_count 4 -test_mode PG1_Internal_scan ...
    
30. scan compression enable...(命令搞忘了)
    
31. set_scan_compression_configuration -test_mode PG1_ScanCompression_mode -base_mode PG1_Internal_scan -chain_count 40
    
32. set_scan_configuration -test_mode PG1_ScanCompression_mode ...(scan chain config设定)
    
33. 
    
34. dft_drc (没有任何DRC问题)
    
35. preview_dft(结果有问题)
    
36. insert_dft
    
37. ...
    
38. ...
    
39. 
    

复制代码

YouHKH

望大神帮帮忙，谢谢。

马奎高

回复 1# YouHKH


   set_scan_configuration -test_mode PG0_ScanCompression_mode_0 ...(scan chain config设定)是不是这里的test_mode 后应该是PG0_Internal_scan啊，23行也是？

YouHKH

回复 3# 马奎高

多谢回复。
其实在18 line已经把-test_mode PG0_Internal_scan 的scan config已经设定好了。18 line：set_scan_configuration -chain_count 4 -test_mode PG0_Internal_scan ...
   
21 line和23 line其实是在设定压缩模式的scan config，所以是PG0_ScanCompression_mode_0/PG0_ScanCompression_mode_1。
20 line ：set_scan_compression_configuration -test_mode PG0_ScanCompression_mode_0 -base_mode PG0_Internal_scan -chain_count 100
21 line：set_scan_configuration -test_mode PG0_ScanCompression_mode_0 -base_mode ...(scan chain config设定)
22 line ： set_scan_compression_configuration -test_mode PG0_ScanCompression_mode_1 -base_mode PG0_Internal_scan -chain_count 40
23 line ：
set_scan_configuration -test_mode PG0_ScanCompression_mode_1 ...(scan chain config设定)

马奎高

回复 4# YouHKH


   应该有点问题，你看看这例子对照下：

1. ## Define the scan in and scan out pins, which will be used in
   
2. ## all test modes.
   
3. ## These modes are my_base1, my_base2, scan_compression1,
   
4. ## scan_compression2, and burn_in.
   
5. for {set i 1} {$i <= 13 } { incr i 1} {
   
6.   create_port -direction in test_si[$i]
   
7.   create_port -direction out test_so[$i]
   
8.   set_dft_signal -type ScanDataIn -view spec \
   
9.     -port test_si[$i] -test_mode all
   
10.   set_dft_signal -type ScanDataOut -view spec \
    
11.     -port test_so[$i] -test_mode all
    
12. }
    
13. # Define Test Clocks
    
14. set_dft_signal -view existing_dft -type TestClock -timing {45 55} \
    
15.   -port clk_st
    
16. # Define TestMode signals to be used
    
17. set_dft_signal -view spec -type TestMode \
    
18.   -port [list i_trdy_de i_trdy_dd i_cs]
    
19. # Define the test modes and usage
    
20. define_test_mode my_base1 -usage scan \
    
21.   -encoding {i_trdy_de 0 i_trdy_dd 0 i_cs 1}
    
22. define_test_mode my_base2 -usage scan \
    
23.   -encoding {i_trdy_de 0 i_trdy_dd 1 i_cs 0}
    
24. define_test_mode burn_in  -usage scan \
    
25.   -encoding {i_trdy_de 0 i_trdy_dd 1 i_cs 1}
    
26. define_test_mode scan_compression1 -usage scan_compression \
    
27.   -encoding {i_trdy_de 1 i_trdy_dd 0 i_cs 0}
    
28. define_test_mode scan_compression2 -usage scan_compression \
    
29.   -encoding {i_trdy_de 1 i_trdy_dd 0 i_cs 1}
    
30. # Enable DFTMAX compression
    
31. set_dft_configuration -scan_compression enable
    
32. # Configure DFTMAX compression
    
33. set_scan_compression_configuration -base_mode my_base1 -chain_count 32  \
    
34.   -test_mode scan_compression1 -xtolerance high
    
35. set_scan_compression_configuration -base_mode my_base2 -chain_count 256 \
    
36.   -test_mode scan_compression2 -xtolerance high
    
37. # Configure the basic scan modes
    
38. set_scan_configuration -chain_count 4 -test_mode my_base1
    
39. set_scan_configuration -chain_count 8 -test_mode my_base2
    
40. set_scan_configuration -chain_count 1 -clock_mixing mix_clocks \
    
41.   -test_mode burn_in
    
42. set_dft_insertion_configuration -synthesis_optimization none
    
43. ## Give a chain spec to be applied in my_base1
    
44. ## This will also define the scan ports for scan_compression1
    
45. set_scan_path chain1 -view spec -scan_data_in test_si[1] \
    
46.   -scan_data_out test_so[1] -test_mode my_base1
    
47. set_scan_path chain2 -view spec -scan_data_in test_si[2] \
    
48.   -scan_data_out test_so[2] -test_mode my_base1
    
49. set_scan_path chain3 -view spec -scan_data_in test_si[3] \
    
50.   -scan_data_out test_so[3] -test_mode my_base1
    
51. set_scan_path chain4 -view spec -scan_data_in test_si[4] \
    
52.   -scan_data_out test_so[4] -test_mode my_base1
    
53. ## Give a chain spec to be applied in my_base2
    
54. ## Give a chain spec to be applied in my_base2
    
55. ## This will also define the scan ports for scan_compression2
    
56. set_scan_path chain5 -view spec -scan_data_in test_si[5] \
    
57.   -scan_data_out test_so[5] -test_mode my_base2
    
58. set_scan_path chain6 -view spec -scan_data_in test_si[6] \
    
59.   -scan_data_out test_so[6] -test_mode my_base2
    
60. set_scan_path chain7 -view spec -scan_data_in test_si[7] \
    
61.   -scan_data_out test_so[7] -test_mode my_base2
    
62. set_scan_path chain8 -view spec -scan_data_in test_si[8] \
    
63.   -scan_data_out test_so[8] -test_mode my_base2
    
64. set_scan_path chain9 -view spec -scan_data_in test_si[9] \
    
65.   -scan_data_out test_so[9] -test_mode my_base2
    
66. set_scan_path chain10 -view spec -scan_data_in test_si[10] \
    
67.   -scan_data_out test_so[10] -test_mode my_base2
    
68. set_scan_path chain11 -view spec -scan_data_in test_si[11] \
    
69.   -scan_data_out test_so[11] -test_mode my_base2
    
70. set_scan_path chain12 -view spec -scan_data_in test_si[12] \
    
71.   -scan_data_out test_so[12] -test_mode my_base2
    
72. ## Give a chain spec to be applied in burn_in
    
73. set_scan_path chain4 -view spec -scan_data_in test_si[13] \
    
74.   -scan_data_out test_so[13] -test_mode burn_in
    
75. ## Create test protocol
    
76. create_test_protocol
    
77. ## Run pre-DFT DRC
    
78. dft_drc
    
79. ## Preview test structures to be inserted
    
80. preview_dft -show all
    
81. ## Run test insertion
    
82. insert_dft
    
83. current_test_mode scan_compression1
    
84. report_dft_signal
    
85. dft_drc -verbose
    
86. current_test_mode scan_compression2
    
87. report_dft_signal
    
88. dft_drc -verbose
    
89. current_test_mode my_base1
    
90. report_dft_signal
    
91. dft_drc -verbose
    
92. current_test_mode my_base2
    
93. report_dft_signal
    
94. dft_drc -verbose
    
95. current_test_mode burn_in
    
96. report_dft_signal
    
97. dft_drc -verbose
    
98. change_names -rules verilog -hierarchy
    
99. write -format verilog -hierarchy -output vg/top_scan_mm.v
    
100. write_test_protocol -test_mode scan_compression1 \
     
101.   -output stil/scan_compression1.stil -names verilog
     
102. write_test_protocol -test_mode scan_compression2 \
     
103.   -output stil/scan_compression2.stil -names verilog
     
104. write_test_protocol -test_mode my_base1 -output stil/my_base1.stil \
     
105.   -names verilog
     
106. write_test_protocol -test_mode my_base2 -output stil/my_base2.stil \
     
107.   -names verilog
     
108. write_test_protocol -test_mode burn_in -output stil/burn_in.stil \
     
109.   -names verilog
     

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马奎高

回复  YouHKH


   应该有点问题，你看看这例子对照下：
马奎高 发表于 2018-8-29 09:27

                               
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   另外，你的IO共享了吗，set_app_var test_enable_codec_sharing true，或者

1. set_scan_compression_configuration
   
2.    -shared_inputs M
   
3.    -shared_outputs N
   

复制代码

YouHKH

回复 6# 马奎高


   谢谢回答。你上面给的例子是没有进行partition，这个能够正确插入DFT电路。

另外，你的IO共享了吗，set_app_var test_enable_codec_sharing true，或者

对于IO共享问题，我对PG0/PG1单独设置scan in/out之后还是不行。

详细见下面两楼，这是完整的tcl和Error Log，麻烦再帮看看，谢谢。

YouHKH

回复 6# 马奎高

是根据你给的tcl例子改的，谢谢。

1. ## Define the scan in and scan out pins, which will be used in
   
2. ## all test modes.
   
3. ## These modes are my_base1, my_base2, scan_compression1,
   
4. ## scan_compression2, and burn_in.
   
5. set_dft_insertion_configuration -synthesis_optimization none
   
6. create_port -direction in {i_trdy_de i_trdy_dd i_cs }
   
7. # Define Test Clocks
   
8. set_dft_signal -view existing_dft -type ScanClock -timing {45 55} -port clk
   
9. set_dft_signal -view existing_dft -type Reset -active_state 0 -port rst_in_n
   
10. # Define TestMode signals to be used
    
11. set_dft_signal -view spec -type TestMode -port [list i_trdy_de i_trdy_dd i_cs]
    
12. # Define the test modes and usage
    
13. define_test_mode my_base1 -usage scan -encoding {i_trdy_de 0 i_trdy_dd 0 i_cs 1}
    
14. define_test_mode my_base2 -usage scan -encoding {i_trdy_de 0 i_trdy_dd 1 i_cs 0}
    
15. #define_test_mode burn_in  -usage scan -encoding {i_trdy_de 0 i_trdy_dd 1 i_cs 1}
    
16. define_test_mode scan_compression1 -usage scan_compression -encoding {i_trdy_de 1 i_trdy_dd 0 i_cs 0}
    
17. define_test_mode scan_compression2 -usage scan_compression -encoding {i_trdy_de 1 i_trdy_dd 0 i_cs 1}
    
18. 
    
19. # Define Partition
    
20. source -e -v pg0_cell.tcl
    
21. source -e -v pg1_cell.tcl
    
22. # PG0
    
23. current_dft_partition PG0
    
24. for {set i 1} {$i <= 4 } { incr i 1} {
    
25.   create_port -direction in test_si[$i]
    
26.   create_port -direction out test_so[$i]
    
27.   set_dft_signal -type ScanDataIn -view spec -port test_si[$i]  -test_mode my_base1
    
28.   set_dft_signal -type ScanDataOut -view spec -port test_so[$i] -test_mode my_base1
    
29. }
    
30. # Configure the basic scan modes
    
31. set_scan_configuration -chain_count 4 -test_mode my_base1
    
32. # Enable DFTMAX compression
    
33. set_dft_configuration -scan_compression enable
    
34. # Configure DFTMAX compression
    
35. set_scan_compression_configuration -base_mode my_base1 -chain_count 32  -test_mode scan_compression1 -xtolerance high
    
36. ## Give a chain spec to be applied in my_base1
    
37. ## This will also define the scan ports for scan_compression1
    
38. set_scan_path chain1 -view spec -scan_data_in test_si[1] -scan_data_out test_so[1] -test_mode my_base1
    
39. set_scan_path chain2 -view spec -scan_data_in test_si[2] -scan_data_out test_so[2] -test_mode my_base1
    
40. set_scan_path chain3 -view spec -scan_data_in test_si[3] -scan_data_out test_so[3] -test_mode my_base1
    
41. set_scan_path chain4 -view spec -scan_data_in test_si[4] -scan_data_out test_so[4] -test_mode my_base1
    
42. # PG1
    
43. current_dft_partition PG1
    
44. for {set i 5} {$i <= 12 } { incr i 1} {
    
45.   create_port -direction in test_si[$i]
    
46.   create_port -direction out test_so[$i]
    
47.   set_dft_signal -type ScanDataIn -view spec -port test_si[$i]  -test_mode my_base2
    
48.   set_dft_signal -type ScanDataOut -view spec -port test_so[$i] -test_mode my_base2
    
49. }
    
50. # Configure the basic scan modes
    
51. set_scan_configuration -chain_count 8 -test_mode my_base2
    
52. # Configure DFTMAX compression
    
53. set_scan_compression_configuration -base_mode my_base2 -chain_count 256 -test_mode scan_compression2 -xtolerance high
    
54. ## Give a chain spec to be applied in my_base2
    
55. ## This will also define the scan ports for scan_compression2
    
56. set_scan_path chain5 -view spec -scan_data_in test_si[5] -scan_data_out test_so[5] -test_mode my_base2
    
57. set_scan_path chain6 -view spec -scan_data_in test_si[6] -scan_data_out test_so[6] -test_mode my_base2
    
58. set_scan_path chain7 -view spec -scan_data_in test_si[7] -scan_data_out test_so[7] -test_mode my_base2
    
59. set_scan_path chain8 -view spec -scan_data_in test_si[8] -scan_data_out test_so[8] -test_mode my_base2
    
60. set_scan_path chain9 -view spec -scan_data_in test_si[9] -scan_data_out test_so[9] -test_mode my_base2
    
61. set_scan_path chain10 -view spec -scan_data_in test_si[10] -scan_data_out test_so[10] -test_mode my_base2
    
62. set_scan_path chain11 -view spec -scan_data_in test_si[11] -scan_data_out test_so[11] -test_mode my_base2
    
63. set_scan_path chain12 -view spec -scan_data_in test_si[12] -scan_data_out test_so[12] -test_mode my_base2
    
64. ## Create test protocol
    
65. create_test_protocol
    
66. ## Run pre-DFT DRC
    
67. dft_drc
    
68. ## Preview test structures to be inserted
    
69. preview_dft -show all
    
70. ## Run test insertion
    
71. insert_dft
    
72. current_test_mode scan_compression1
    
73. report_dft_signal
    
74. dft_drc -verbose
    
75. current_test_mode scan_compression2
    
76. report_dft_signal
    
77. dft_drc -verbose
    
78. current_test_mode my_base1
    
79. report_dft_signal
    
80. dft_drc -verbose
    
81. current_test_mode my_base2
    
82. report_dft_signal
    
83. dft_drc -verbose
    
84. change_names -rules verilog -hierarchy
    
85. write -format verilog -hierarchy -output vg/top_scan_mm.v
    
86. write_test_protocol -test_mode scan_compression1 -output stil/scan_compression1.stil -names verilog
    
87. write_test_protocol -test_mode scan_compression2 -output stil/scan_compression2.stil -names verilog
    
88. write_test_protocol -test_mode my_base1 -output stil/my_base1.stil -names verilog
    
89. write_test_protocol -test_mode my_base2 -output stil/my_base2.stil -names verilog
    
90. #write_test_protocol -test_mode burn_in -output stil/burn_in.stil \
    
91. #  -names verilog
    

复制代码

YouHKH

Error Log详细：
## Define the scan in and scan out pins, which will be used in
## all test modes.
## These modes are my_base1, my_base2, scan_compression1,
## scan_compression2, and burn_in.
set_dft_insertion_configuration -synthesis_optimization none
Accepted insert_dft configuration specification.
1
create_port -direction in {i_trdy_de i_trdy_dd i_cs }
Creating port 'i_trdy_de' in design 'DW8051_core'.
Creating port 'i_trdy_dd' in design 'DW8051_core'.
Creating port 'i_cs' in design 'DW8051_core'.
1
# Define Test Clocks
set_dft_signal -view existing_dft -type ScanClock -timing {45 55} -port clk
Accepted dft signal specification for modes: all_dft
1
set_dft_signal -view existing_dft -type Reset -active_state 0 -port rst_in_n
Accepted dft signal specification for modes: all_dft
1
# Define TestMode signals to be used
set_dft_signal -view spec -type TestMode -port [list i_trdy_de i_trdy_dd i_cs]
Accepted dft signal specification for modes: all_dft
1
# Define the test modes and usage
define_test_mode my_base1 -usage scan -encoding {i_trdy_de 0 i_trdy_dd 0 i_cs 1}
Defining test mode my_base1 in view existing_dft
Defining test mode my_base1 in view spec
Current test mode is 'my_base1'.
1
define_test_mode my_base2 -usage scan -encoding {i_trdy_de 0 i_trdy_dd 1 i_cs 0}
Defining test mode my_base2 in view existing_dft
Defining test mode my_base2 in view spec
Current test mode is 'my_base2'.
1
#define_test_mode burn_in  -usage scan -encoding {i_trdy_de 0 i_trdy_dd 1 i_cs 1}
define_test_mode scan_compression1 -usage scan_compression -encoding {i_trdy_de 1 i_trdy_dd 0 i_cs 0}
Defining test mode scan_compression1 in view existing_dft
Defining test mode scan_compression1 in view spec
Current test mode is 'scan_compression1'.
1
define_test_mode scan_compression2 -usage scan_compression -encoding {i_trdy_de 1 i_trdy_dd 0 i_cs 1}
Defining test mode scan_compression2 in view existing_dft
Defining test mode scan_compression2 in view spec
Current test mode is 'scan_compression2'.
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# Define Partition
source -e -v pg0_cell.tcl

define_dft_partition PG0 -include { cell list1}
source -e -v pg1_cell.tcl
define_dft_partition PG0 -include { cell list2}
DFT Partition PG1 has been correctly updated.
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1
current_dft_partition PG0
Current DFT Partition is set to 'PG0'.
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for {set i 1} {$i <= 4 } { incr i 1} {
  create_port -direction in test_si[$i]
  create_port -direction out test_so[$i]
  set_dft_signal -type ScanDataIn -view spec -port test_si[$i]  -test_mode my_base1
  set_dft_signal -type ScanDataOut -view spec -port test_so[$i] -test_mode my_base1
}
Creating port 'test_si[1]' in design 'DW8051_core'.
Creating port 'test_so[1]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Creating port 'test_si[2]' in design 'DW8051_core'.
Creating port 'test_so[2]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Creating port 'test_si[3]' in design 'DW8051_core'.
Creating port 'test_so[3]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Creating port 'test_si[4]' in design 'DW8051_core'.
Creating port 'test_so[4]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG0' and modes: my_base1
Accepted dft signal specification for partition 'PG0' and modes: my_base1
# Configure the basic scan modes
set_scan_configuration -chain_count 4 -test_mode my_base1
Accepted scan configuration in partition 'PG0' for modes: my_base1
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# Enable DFTMAX compression
set_dft_configuration -scan_compression enable
Accepted dft configuration specification.
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# Configure DFTMAX compression
set_scan_compression_configuration -base_mode my_base1 -chain_count 32  -test_mode scan_compression1 -xtolerance high
Accepted scan compression specification for design 'DW8051_core' in partition 'PG0'.
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## Give a chain spec to be applied in my_base1
## This will also define the scan ports for scan_compression1
set_scan_path chain1 -view spec -scan_data_in test_si[1] -scan_data_out test_so[1] -test_mode my_base1
Accepted scan path specification for partition 'PG0' and mode 'my_base1'
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set_scan_path chain2 -view spec -scan_data_in test_si[2] -scan_data_out test_so[2] -test_mode my_base1
Accepted scan path specification for partition 'PG0' and mode 'my_base1'
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set_scan_path chain3 -view spec -scan_data_in test_si[3] -scan_data_out test_so[3] -test_mode my_base1
Accepted scan path specification for partition 'PG0' and mode 'my_base1'
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set_scan_path chain4 -view spec -scan_data_in test_si[4] -scan_data_out test_so[4] -test_mode my_base1
Accepted scan path specification for partition 'PG0' and mode 'my_base1'
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current_dft_partition PG1
Current DFT Partition is set to 'PG1'.
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for {set i 5} {$i <= 12 } { incr i 1} {
  create_port -direction in test_si[$i]
  create_port -direction out test_so[$i]
  set_dft_signal -type ScanDataIn -view spec -port test_si[$i]  -test_mode my_base2
  set_dft_signal -type ScanDataOut -view spec -port test_so[$i] -test_mode my_base2
}
Creating port 'test_si[5]' in design 'DW8051_core'.
Creating port 'test_so[5]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[6]' in design 'DW8051_core'.
Creating port 'test_so[6]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[7]' in design 'DW8051_core'.
Creating port 'test_so[7]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[8]' in design 'DW8051_core'.
Creating port 'test_so[8]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[9]' in design 'DW8051_core'.
Creating port 'test_so[9]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[10]' in design 'DW8051_core'.
Creating port 'test_so[10]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[11]' in design 'DW8051_core'.
Creating port 'test_so[11]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Creating port 'test_si[12]' in design 'DW8051_core'.
Creating port 'test_so[12]' in design 'DW8051_core'.
Accepted dft signal specification for partition 'PG1' and modes: my_base2
Accepted dft signal specification for partition 'PG1' and modes: my_base2
# Configure the basic scan modes
set_scan_configuration -chain_count 8 -test_mode my_base2
Accepted scan configuration in partition 'PG1' for modes: my_base2
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# Configure DFTMAX compression
set_scan_compression_configuration -base_mode my_base2 -chain_count 256 -test_mode scan_compression2 -xtolerance high
Accepted scan compression specification for design 'DW8051_core' in partition 'PG1'.
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#set_scan_configuration -chain_count 1 -clock_mixing mix_clocks #  -test_mode burn_in
## Give a chain spec to be applied in my_base2
## Give a chain spec to be applied in my_base2
## This will also define the scan ports for scan_compression2
set_scan_path chain5 -view spec -scan_data_in test_si[5] -scan_data_out test_so[5] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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set_scan_path chain6 -view spec -scan_data_in test_si[6] -scan_data_out test_so[6] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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set_scan_path chain7 -view spec -scan_data_in test_si[7] -scan_data_out test_so[7] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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set_scan_path chain8 -view spec -scan_data_in test_si[8] -scan_data_out test_so[8] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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set_scan_path chain9 -view spec -scan_data_in test_si[9] -scan_data_out test_so[9] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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set_scan_path chain10 -view spec -scan_data_in test_si[10] -scan_data_out test_so[10] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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set_scan_path chain11 -view spec -scan_data_in test_si[11] -scan_data_out test_so[11] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
1
set_scan_path chain12 -view spec -scan_data_in test_si[12] -scan_data_out test_so[12] -test_mode my_base2
Accepted scan path specification for partition 'PG1' and mode 'my_base2'
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### Give a chain spec to be applied in burn_in
#set_scan_path chain4 -view spec -scan_data_in test_si[13] #  -scan_data_out test_so[13] -test_mode burn_in
## Create test protocol
create_test_protocol
In mode: all_dft...

Information: Starting test protocol creation. (TEST-219)
  ...reading user specified clock signals...
Information: Identified system/test clock port clk (45.0,55.0). (TEST-265)
  ...reading user specified asynchronous signals...
Information: Identified active low asynchronous control port rst_in_n. (TEST-266)
Warning: The output strobe for the mode is '40.000000'.
         The output strobe inferred from the waveform table '_default_WFT_' is -1.000000.
The output strobe will be updated

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dft_drc 没有问题

preview_dft

Warning: The following synthetic libraries should be added to

the list of link libraries:

'dw_foundation.sldb'. (UISN-26)
Warning: Design 'DW8051_core' contains 2 high-fanout nets. A fanout number of 1000 will be used for delay calculations involving these nets. (TIM-134)
  Information: Using test design rule information from previous dft_drc run.
Architecting Scan Compression structures
  Architecting Scan Chains
  Information: CODEC parameters of partition PG0 are being applied to the current partiton.
  Information: CODEC parameters of partition PG0 are being applied to the current partiton.
Architecting scan compression mode scan_compression1 with base mode my_base1 and partition PG0
Warning: The compressor generated might have lower diagnostics precision. (TEST-1603)
Architecting Load Decompressor (version 5.8)
  Number of inputs/chains/internal modes = 5/44/4
Architecting Unload compressor (version 5.8)
  Number of outputs/chains = 5/44
  Information: Compressor will have 100% x-tolerance
Architecting scan compression mode scan_compression1 with base mode Internal_scan and partition PG1
Error: Cannot architect compressor with 0 inputs and 0 outputs. (TEST-1100)
Info: Base mode Internal_scan has 0 chains
Architecting scan compression mode scan_compression2 with base mode Internal_scan and partition PG0
Architecting scan compression mode scan_compression2 with base mode my_base2 and partition PG1
0
dc_shell> s

马奎高

回复 9# YouHKH


   我试了一下，确实会发生错误，然后更改了一下，在PG0和PG1都定义所有test mode后preview就正常了，由于我的代码无法考出，给出下面的流程代码

1. read_ddc ./design_test_ready.ddc
   
2. current_design block
   
3. set_dft_configuration -scan_compression enable
   
4. define_test_mode my_scan_comp -usage scan_compression
   
5. define_test_mode test_mode1 -usage scan
   
6. define_test_mode test_mode2 -usage scan
   
7. define_dft_partition partition1 -include [list inst1 inst2]
   
8. define_dft_partition partition2 -include [list inst3 inst4]
   
9. current_dft_partition part1
   
10. set_scan_configuration -chain_count 4 -test_mode test_mode1
    
11. set_scan_configuration -chain_count 8 -test_mode test_mode2
    
12. set_scan_compression_configuration -location inst1 \
    
13.   -test_mode my_scan_comp -base_mode test_mode1
    
14. current_dft_partition part2
    
15. set_scan_configuration -chain_count 8 -test_mode test_mode1
    
16. set_scan_configuration -chain_count 10 -test_mode test_mode2
    
17. set_scan_compression_configuration -location inst3 \
    
18.   -test_mode my_scan_comp -base_mode test_mode1
    
19. current_dft_partition default_partition
    
20. set_scan_configuration -chain_count 2 -test_mode test_mode1
    
21. set_scan_configuration -chain_count 4 -test_mode test_mode2
    
22. set_scan_compression_configuration -location  inst5 \
    
23.   -test_mode my_scan_comp -base_mode test_mode1
    
24. create_test_protocol
    
25. report_dft_partition
    
26. preview_dft -show all
    
27. insert_dft
    
28. dft_drc
    
29. write_scan_def -output ./design.scandef
    
30. write -f ddc -hierarchy -output ./scan_inserted_design.ddc
    
31. write_test_protocol -output scan.spf -test_mode test_mode1
    
32. write_test_protocol -output ascan.spf -test_mode my_scan_comp
    

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