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Title: | | Introduction to Mixed-Signal IC Test and Measurement (2nd Edition) | Publisher: | | Oxford University Press | Copyright / Pub. Date: | | © 2012 | ISBN: | | 978-0-19-979621-2 | Electronic ISBN: | | 978-1-61344-948-6 | No. Pages: | | 861 | Author/Editor: | | By: Roberts, Gordon; Taenzler, Friedrich; Burns, Mark | Knovel Release Date: | | Jul 12, 2012 | Knovel Subject Area(s): | | Electronics & Semiconductors
Computer Hardware Engineering
| Description: | | With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, this book encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming. It includes examples and illustrations, featuring state-of-the-art industrial technology, to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer. |
Table of content
96212_toc.pdf
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2012 2nd Edition Intro to Mixed Signal IC Testing.zip
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