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Agilent’s parametric measurement handbook is an essential reference tool for anyone involved with any aspect of parametric test. The handbook is logically organized, and begins by giving a brief overview of parametric test and a history of parametric test instrumentation. It then continues on and covers measurement basics such as measurement terminology, shielding and guarding, and noise. Next, there are chapters devoted to source/monitor unit (SMU) technology and the intricacies of on-wafer parametric measurement. More advanced topics such as high-speed measurements are also covered in subsequent chapters. The final chapters explain the practical measurement concerns surrounding the measurement of resistors, diode, transistors, and capacitors.
The parametric measurement handbook.pdf
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