|
马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。
您需要 登录 才可以下载或查看,没有账号?注册
×
Total 75 pages, and here is the outline of this PDF document.
Outline:
1. VLSI testing
1.1 Introduction
1.2 Fault modeling
1.3 Test generation
2. Design for testability (DFT)
3. Fault simulation (TetraMax-ATPG)
4. Lab Time |
|