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CTL FOR TEST INFORMATION OF DIGITAL ICs

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发表于 2009-2-26 15:25:03 | 显示全部楼层 |阅读模式

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CTL (proposed standard as IEEE  1450.6, Core Test Language) is a language
that has many possible  applications in the area of test. The  language reuses
syntax defined by IEEE 1450 and IEEE 1450.1 and was created primarily for
the proposed IEEE 1500 standard. As it can be seen, CTL is a language with
a conglomeration of concepts  that is  spread thin across multiple  documents.
As a result I saw a need to put the basic concepts of CTL in a single location.
CTL has been  created by a  small team of experts who work for  different
companies in test-technology and test-automation. They created the  language
over a span of about three years as a company-sponsored volunteer activity.
The author would  like to acknowledge the contributions  these people and
their associated companies have made to the language.
This book  should be read by anyone who is  interested in  testing integrated
circuits. The  contents of this book are especially  relevant to the  segment of
the industry that is  developing  cores  and/or using cores  in system-on-chip
methodologies.

1402072937.zip

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发表于 2009-6-10 01:27:52 | 显示全部楼层

thank you very much. ....

thank you very much. ....
发表于 2010-3-23 18:57:18 | 显示全部楼层
It is a very good book for design to mass production!!
Thanks,
发表于 2011-9-2 19:09:26 | 显示全部楼层
没搞错吧,怎么回事啊
发表于 2014-4-3 20:44:31 | 显示全部楼层
cvbnbnvbn
发表于 2016-9-25 09:19:21 | 显示全部楼层
CTL FOR TEST INFORMATION OF DIGITAL ICs
发表于 2017-10-13 10:07:08 | 显示全部楼层
CTL FOR TEST INFORMATION OF DIGITAL ICs
发表于 2018-7-19 07:24:34 | 显示全部楼层
thanks for the sharing.
发表于 2020-2-6 21:53:19 | 显示全部楼层
Thanks
发表于 2020-2-19 15:29:24 | 显示全部楼层
Thanks!
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