|
楼主 |
发表于 2008-10-13 09:01:55
|
显示全部楼层
2008年卷
Characterization of Semiconductor Heterostructures and Nanostructures
Author(s): Carlo Lamberti
Publisher: Elsevier
Date : July 14, 20
Pages : 496
Format : PDF
OCR : Y
Quality :
Language :
ISBN : 0444530991
Product Description
Characterization of Semiconductor Heterostructures and Nanostructures is structured in chapters, each one devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. A chapter is devoted to the ab initio modeling. The book has basically a double aim. The first one lies on the educational ground. The book provides the basic concept of each of the selected techniques with an approach understandable by master and PhD students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: a first part devoted to explain the basic concepts, providing the larger possible audience, and a second one to the discussion of the most peculiar and innovative examples, allowing the book to have the longer possible life time. Of course, the book is devoted to the specialized subset of scientists working in the fields of design, growth, characterization, testing of heterostructures-based devices in both academic and industrial laboratories. But the final goal is somewhat more ambitious, and in this regard the topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (even sub-nanometer) scale. In this way it is aimed to become a reference book in the much broader, and extremely hot, field of Nanotechnology.
Contents
Chapter 1: Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques
Chapter 2: Ab initio studies of structural and electronic properties
Chapter 3: Electrical characterization of nanostructures
Chapter 4: Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction
Chapter 5: Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures
Chapter 6: Accessing structural and electronic properties of semiconductor
Chapter 7: Power-dependent cathodoluminescence in III-nitrides
Chapter 8: Raman spectroscopy
Chapter 9: X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures
Chapter 10: Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering
Chapter 11: Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures
Chapter 12: The role of photoemission spectroscopies in heterojunction research
Chapter 13: ESR of interfaces and nanolayers in semiconductor heterostructures |
|