ADC histogram testing with ADI and maxim reference (matlab code)

transistor7 · 发表于昨天 11:47

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本帖最后由 transistor7 于 2024-12-24 12:06 编辑

The histogram test approach helps determine nonlinearity parameters such as differential and integral nonlinearities (INL and DNL) in data converters.

A sinewave is often used as an input to the ADC when making histogram DNL and INL measurements. Sinewaves can be generated with extremely high linearity and low noise with appropriate filtering.

ADI - Data-Conversion-Handbook/Chapter5.pdf

Maxim - histogram testing determines dnl and inl

transistor7 · 发表于昨天 12:02

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dnlinl_sin.zip (923 Bytes, 下载次数: 1 )

python code to implement histogram testing method to check DNL/INL

[原创] ADC histogram testing with ADI and maxim reference (matlab code)

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