|
100资产
求助几个资料的资源
1.A. J. van de Goor, Testing Semiconductor Memories: Theory and Practice, John Wiley & Sons, Chichester, UK, 1991.
2.P. Mazumder and K. Chakraborty, Testing and Testable Design of High-Density Random-Access Memories, Frontiers in Electronic Testing, Kluwer Academic Publishers, Boston, June 1996,ISBN 0792397827.
3.P. Mazumder and K. Chakraborty, Testing and Testable Design of High-Density Random-Access Memories, Frontiers in Electronic Testing, Kluwer Academic Publishers, Boston, June 1996,ISBN 0792397827.
|
|