寻求高压ESD文献一篇

jiangbing1975 · 发表于 2011-5-4 15:36:52

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《Drain Extended NMOS High Current Behavior and ESD Protection Strategy for HV Applications in Sub-100nm CMOS Technologies 》
This paper appears in: Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Issue Date: 15-19 April 2007
On page(s): 342 - 347
Location: Phoenix, AZ
Print ISBN: 1-4244-0919-5
INSPEC Accession Number: 9508169
Digital Object Identifier: 10.1109/RELPHY.2007.369913
Date of Current Version: 11 六月 2007
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