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发表于 2008-10-13 12:24:08
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Part I
Chapter 1: Power Supply Compensation for Capacitive Loads
Jonathan L. Fasig, Principal Engineer, Mayo Clinic
Barry K. Gilbert, Director, Mayo Clinic
Erik S. Daniel, Deputy Director, Mayo Clinic
1.1: Abstract
1.2: Introduction
1.3: System Overview
1.4: Power Supply Stability Primer
1.5: Analysis
1.6: Conclusion
Chapter 2: DC-DC Converters: What is Wrong with Them ?
(DesignCon2007)
Emerging Challenges of DC-DC Converters
Istvan Novak, Senior Signal Integrity Staff Engineer, Sun Microsystems
2.1: Abstract
2.2: Introduction
2.3: DC-DC Converter Parameters Related to Signal Integrity
2.4: Potential SI Problems from the User's Perspective
2.5: Conclusion
Chapter 3: The Advantage of Controlled-ESR Polymer Capacitators
Hideki Ishida, Design and Application Section Manager, Sanyo Electric Co.
3.1: Abstract
3.2: Controlling ESR Value of Tantalum Polymer Capacitor
3.3: Importance of Controlled ESR Value Capacitor
3.4: Tantalum Polymer Capacitor with DC/DC Converter Switching in the MHz Range
3.5: Equivalent Circuit of Polymer Tantalum Capacitor
Chaper 4: ESR-Controlled MLCCs and Decoupling Capacitor Network Design
Masaaki Togashi, Senior Development Engineer, TDK Corp.
Chris Burket, Senior Applications Engineer, TDK Corp.
4.1: Abstract
4.2: Introduction
4.3: Decoupling Capacitor Network
4.4: ESR and ESL
4.5: ESR Control Method
4.6: ESR/ESL Measurement of MLCCs
4.7: Measurement Results
4.8: Circuit Analysis using SPICE Simulation
4.9: Lower ESL Development
4.10: Conclusion
Part II
Chapter 5: A Power Distribution System ?
K. Barry A. Williams: Designing Power Distribution Systems for Electronic Circuits. Aikman Engineering LLC, 2005.
K. Barry A. Williams, Principal Engineer, Hewlett-Packard
5.1: Abstract
5.2: An Example of a Power Distribution Design System
5.3: The Problem Schematic
5.4: The Characterization of the Load
5.5: System Bandwidth
5.6: Determination of the Maximum Impedance
5.7: The Q of the System
5.8: Capacitance and Inductance Determination
5.9: Resonant Frequency Points
5.10: Number of Capacitors
5.11: Summary of Compiled Results
5.12: Summary of the Capacitor Selections and Graphical Selections
5.13: Graphics Results with Added Resistance
5.14: Sensitivity
5.15: Summary of the Design
Chapter 6: Designing Minimum Cost VRM8.2/8.3 Compliant Converters?
Richard Redl, President, ELFI S.A.
Brian Erisman, Project Engineer, Analog Devices, Inc.
6.1: Abstract
6.2: Introduction
6.3: Objective Specifications
6.4: Load Transient Performance Limits of the Buck Converter
6.5: Optimal Load Transient Response
6.6: Commonly Used Control Techniques
6.7: Design for Optimal Output Impedance
6.8: Computer Simulations and Experimental Results
6.9: Summary
Chapter 7: Frequency Domain Target Impedence Method for Bypass Capacitator Selection for Power Distribution Systems
Larry D. Smith, Principal Signal Integrity Engineer, Altena Corp.
7.1: Abstract
7.2: Introduction
7.3: Target Impedance
7.4: Impedance in the Frequency Domain
7.5: PCB Bypass Capacitor
7.6: Capacitor Sizing from Target Impedance and Corner Frequency
7.7: ESR Considerations
7.8: Problems at High and Low Frequency
7.9: Comparing FDTIM to Other Methods
7.10: Conclusion
Chapter 8: Resonant-Free Power Network Design Using Extended Adaptive Voltage Positioning Methodology
Alex Waizman, Principal Engineer, Intel Corp.
Chee-Yee Chung, Principal Engineer, Intel Corp.
8.1: Abstract
8.2: Introduction
8.3: Lumped Power Delivery Model
8.4: Adaptive Voltage Positioning
8.5: EAVP
8.6: Time Domain Results
8.7: Future Work
8.8: Summary
Chapter 9: Distributed Matched Bypassing for Board-Level Power Distribution Networks
Istvan Novak, Senior Staff Engineer, Sun Microsystems
Leesa Noujeim, Staff Engineer, Sun Microsystems
Valerie St. Cyr, Supply Base Development Manager, Sun Microsystems
Nick Biunno, Principal Engineer, Sanmina-SCI
Atul Patel, Process Engineer, Sanmina-SCI
George Korony, Senior Member of Technical Staff, AVX Corp.
Andy Ritter, Senior Member of Technical Staff, AVX Corp.
9.1: Abstract
9.2: Introduction
9.3: Distributed Matched Bypassing of Power Distribution Networks
9.4: Implementation of Distributed Matched Bypassing
9.5: The Concept of the Bypass Resistor
9.6: Conclusion
Part III
Chapter 10: Comparison of Power Distribution Network Design Methods: An Approach to System-Level Power Distribution Analysis
Dale Becker, Senior Technical Staff Member, IBM Corp.
10.1: Abstract
10.2: Introduction
10.3: A Computer System
10.4: Power Distribution Noise Analysis
10.5: Summary
Chapter 11: Bypass Filter Design Considerations for Modern Digital Systems, a Comparative Evaluation of the Big 'V,' Multipole, and Many Pole Bypass Strategies
Steve Weir, Consultant, Teraspeed Consultant Group
11.1: Abstract
11.2: What Does the Bypass Network Do?
11.3: Multilayer Chip Capacitor Bypass Basics
11.4: Bypass Strategies--Three Methods, Three Faiths?
11.5: Summary
11.6: Conclusion
Chapter 12: Comparison of Power Distribution Network Design Methods: Bypass Capacitator Selection Based on Time Domain and Frequency Domain Preferences
Istvan Novak, Senior Signal Integrity Staff Engineer, Sun Microsystems
12.1: Abstract
12.2: Introduction
12.3: So, What Is the Metric?
12.4: Comparison of Popular Methods Based on Lumped Self-Impedance
12.5: Component Placement
12.6: Implementation Examples
12.7: Conclusion
Chapter 13: PDN Design Strategies: Ceramic SMT Decoupling Capacitators--What Values Should I Choose
James L. Knighten, Senior Staff Engineer, NCR Corp.
Bruce Archambeault, Distinguished Engineer, IBM
Jun Fan, Senior Hardware Engineer, NCR Corp.
Giuseppe Selli, Ph.D. Candidate, University of Missouri-Rolla
Samuel Connor, Senior Engineer, IBM
James L. Drewniak, Professor, University of Missouri-Rolla
13.1: Introduction
13.2: The Power Bus Function
13.3: The Decoupling Capacitor
13.4: Interconnect Inductance
13.5: Conclusion
Part IV
Chapter 14: Power Integrity Analysis of DDR2 Memory Systems during Simultaneous Switching Events
Ralf Schmitt, Signal Integrity Engineer, Rambus, Inc.
Joong-Ho Kim, Signal Integrity Engineer, Rambus, Inc.
Chuck Yuan, Signal Integrity Engineer, Rambus, Inc.
June Feng, Signal Integrity Engineer, Rambus, Inc.
Woopoung Kim, Signal Integrity Engineer, Rambus, Inc.
Dan Oh, Signal Integrity Engineer, Rambus, Inc.
14.1: Abstract
14.2: Introduction
14.3: Supply Noise Modeling Methodology for Interface Systems
14.4: SSN Model for DDR2 Test System
14.5: Determining Worst-Case Switching Profiles
14.6: Correlating Supply Noise Parameters
14.7: Measuring Supply Noise on Internal Supply Voltage
14.8: Summary
Chapter 15: Analysis of Supply Noise Induced Jitter in Gigabit I/O Interfaces
Ralf Schmitt, Signal Integrity Engineers, Rambus, Inc.
Hai Lan, Signal Integrity Engineer, Rambus, Inc.
Chris Madden, Signal Integrity Engineer, Rambus, Inc.
Chuck Yuan, Signal Integrity Engineer, Rambus, Inc.
15.1: Abstract
15.2: Introduction
15.3: Power Supply Design Environment Requirements for Gigabit I/O Interfaces
15.4: Overview of Gigabit I/O Interface Test System
15.5: Measurement of Supply Noiseâ |
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