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本帖最后由 craybird 于 2025-8-26 18:43 编辑
I want to learn DFT in S. Unfortunately, despite the completeness of the guides from S, many things are not explained. Instead, links to articles in SolvNet are given. I do not have a SolvNet account. If you have access to SolvNet, please help me download articles from my list. I will be very grateful to this hero!
SolvNet article 034774, "How To Connect DFT Signals to Hierarchical Pins of Verilog Wrappers"
SolvNet article 2543967, "The Pipelined ScanEnable Fanout Limit, Duplicate Scan-Enable Signals, and the TEST-1073 Error"
SolvNet article 2552200, "Visualizing Pipelined Scan-Enable Clusters in the Layout View"
SolvNet article 039402, "How Can I Use Additional Boundary-Scan Features With IEEE 1500 Test-Mode Control?"
SolvNet article 040136, "Using the Internal Pins Flow With Internal Test Registers”"
SolvNet article 1918995, "How Do Wrapper Chains and Wrapper Cells Work in Detail?"
SolvNet article 3017081, "How Does Core Wrapping Identify Clock Ports for Exclusion?"
SolvNet article 2138931, "Why Are There Two Ways to Specify Input and Output Wrapper Shift Signals?"
SolvNet article 038531, "What Are the Reasons for Dedicated Wrapper Cells to Be Inserted?"
SolvNet article 2686021, "How To Preserve Special Logic When Creating an EXTEST Netlist"
SolvNet article 034274, "DFT-inserted OCC Controller Data Sheet"
SolvNet article 037838, "How Can I Use the Same Clock Port for the ATE and PLL Reference Clocks?"
SolvNet article 034274, "DFT-inserted OCC Controller Data Sheet"
SolvNet article 022490, "Static Timing Analysis Constraints for On-Chip Clockin"
SolvNet article 035708, "What Does the test_ate_sync_cycles Variable Do?"
SolvNet article 018046, "How Can I Control Scan Stitching of OCC Controller Clock Chains?"
SolvNet article 2898128, "Excluding User-Defined OCC Controllers from DFT Insertion"
SolvNet article 2819507, "Simulation Fails Due to Bad ICG Test-Pin Connection in User-Defined OCC Controller"
SolvNet article 017172 "Converting Block-Level SCANDEF to Upper-Level SCANDEF"
SolvNet article 022408, "Determining START and STOP Points in a SCANDEF File"
SolvNet article 2314593, "SCANDEF Generation Limitations for Multiple Test Modes"
SolvNet article 2675107, "Concatenating OCC Clock Chains From Multiple DFT Partitions"
SolvNet article 036993, "What Do R10 and R11 DRC Violations Mean?"
SolvNet article 2685005, "How Are OCC Clocks Chosen for Pipelined Scan Data Registers?"
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