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TABLE OF CONTENTS
AEC - Q100 STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
Appendix 1 - Definition of a Qualification Family
Appendix 2 - Certification of Design, Construction and Qualification
Appendix 3 - Package Opening
Attachments
1. AEC - Q100-001 BOND SHEAR TEST
2. AEC - Q100-002 HUMAN BODY MODEL ELECTROSTATIC
DISCHARGE TEST
3. AEC - Q100-003 MACHINE MODEL ELECTROSTATIC
DISCHARGE TEST
4. AEC - Q100-004 IC LATCH-UP TEST
5. AEC - Q100-005 E2PROM ENDURANCE/ DATA RETENTION
TEST
6. AEC - Q100-006 ELECTRO-THERMALLY INDUCED GATE
LEAKAGE TEST
7. AEC - Q100-007 FAULT SIMULATION AND TEST GRADING
8. AEC - Q100-008 EARLY LIFE FAILURE RATE (ELFR)
9. AEC - Q100-009 ELECTRICAL DISTRIBUTION ASSESSMENT
10. AEC - Q100-010 SOLDER BALL SHEAR
11. AEC - Q100-011 CHARGED DEVICE MODEL ELECTROSTATIC
DISCHARGE TEST |
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发表于 2008-3-7 09:04:08
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