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The oretical and Experimental Analysis of Dickson Charge Pump Output Resistance
Towards SET Mitigation in RF Digital PLLs_ From Error Characterization to Radiation Hardening Considerations
Transient Charging and Discharging Behaviors of Border Traps in the Dual-Layer $hbox{HfO}_{2}_hbox{SiO}_{2}$ High- $kappa$ Gate Stack Observed by Using Low-Frequency Charge Pumping Method
Ultra-High-Voltage Charge Pump Circuit in Low-Voltage Bulk CMOS Processes With Polysilicon Diodes |
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发表于 2008-12-1 18:28:18
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