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1,Package Design Consideration for Suppressing Radiated EMI Noise in Semi-Bridgeless PFC Converters
https://ieeexplore.ieee.org/document/10147635
2,CMOS Gate Driver with Integrated Ultra-Accurate and Fast Gate Charge Sensor for Robust and Ultra-Fast Short Circuit Detection of SiC Power Modules
https://ieeexplore.ieee.org/document/10147567
3,Novel Multifunctional Transient Voltage Suppressor Technology for Modular EOS/ESD Protection Circuit Designs
https://ieeexplore.ieee.org/document/10147403
4,Gate Driver IC with Fully Integrated Overcurrent Protection Function by Measuring Gate-to-Emitter Voltage During IGBT Conduction
https://ieeexplore.ieee.org/document/10147568
5,Application of a Smart Gate Driver to Detect Aging in SiC Power MOSFETs
https://ieeexplore.ieee.org/document/10147513
6,A 600-V GaN Active Gate Driver with Level Shifter Common-Mode Noise Sensing for Built-In dV/dt Self-Adaptive Control
https://ieeexplore.ieee.org/document/10147641
7,A High-Speed Level Shifter with dVS/dt Noise Immunity Enhancement Structure for 200V Monolithic GaN Power IC
https://ieeexplore.ieee.org/document/10147560
8,Gate Current Peaks Due to CGD Overcharge in SiC MOSFETs Under Short-Circuit Test
https://ieeexplore.ieee.org/document/10147438
9,Investigations of Residual Damage in SiC Trench MOSFETs After Single and Multiple Short-Circuit Stress
https://ieeexplore.ieee.org/document/10147463
10,Impact of Layout Arrangement on Surge Current and Avalanche Robustness of Silicon Carbide JBS Diodes
https://ieeexplore.ieee.org/document/10147620
11,Proposal of Vertical-Channel Fin-SiC MOSFET Toward Future Device Scaling
https://ieeexplore.ieee.org/document/10147561
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